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Bryan M. Barnes, Lowell P. Howard, P Lipscomb, Richard M. Silver
Patterns of lines and trenches with nominal linewidths of 50 nm have been proposed for use as an overlay target appropriate for placement inside the patterned
Smart Machining Systems improve manufacturing efficiency using optimization based on process models. Cutting force models developed from a narrow set of
Effective visualizations can help researchers obtain a more complete understanding of high level mathematical functions that arise in mathematics, statistics
M Colket, T Edwards, S Williams, N Cernansky, D L. Miller, Fokion N. Egolfopoulos, P Linstedt, Ram Seshadri, F L. Dryer, C K. Law, Daniel G. Friend, David Lenhert, Heinz Pitsch, A Sarofim, M Smooke, Wing Tsang
The engineering and scientific community ha been searching for the identification of surrogate fuels that can reasonably represent the performance and emissions
B C. Park, J Choi, S J. Ahn, D H. Kim, L Joon, Ronald G. Dixson, Ndubuisi George Orji, Joseph Fu, Theodore V. Vorburger
The ever decreasing size of semiconductor features demands the advancement of critical dimension atomic force microscope (CD-AFM) technology, for which the
Brian C. Stanton, Brian Antonishek, Jean C. Scholtz
The National Institute of Standards and Technology (NIST) conducted three workshops with First Responders to determine requirements for robots used in Urban
J M. Guevremont, G H. Guinther, D Szemenyei, Mark Devlin, T-C Jao, Cherno Jaye, Joseph Woicik, Daniel A. Fischer
Traditionally, wear protection and friction modification by engine oil are provided by zinc dithiophosphate (ZDDP) or other phosphorus compounds. These
Wafer exposure process simulation and optical photomask feature metrology both rely on optical image modeling for accurate results. The best way to gauge the
Kate Remley, Galen H. Koepke, Elena R. Messina, Adam S. Jacoff, George Hough
To gather data in support of standards development for urban search and rescue robots, NIST is conducting a series of field tests to quantify the functionality
Shuhui Kang, B D. Vogt, Wen-Li Wu, Vivek Prabhu, David L. VanderHart, Ashwin Rao, Eric K. Lin, Karen Turnquest
A general approach to characterize compositional heterogeneity in polymer thin films using Fourier transform infrared (FTIR) spectroscopy has been demonstrated
Chemically amplified photoresists are likely to remain the primary imaging materials for the semiconductor industry. As feature sizes decrease to dimensions
Kwang-Woo Choi, Vivek Prabhu, Kristopher Lavery, Eric K. Lin, Wen-Li Wu, John T. Woodward IV, Michael Leeson, H Cao, Manish Chandhok, George Thompson
Current extreme ultraviolet (EUV) photoresist materials do not yet meet requirements on exposure-dose sensitivity, line-width roughness (LWR), and resolution
Shuhui Kang, Wen-Li Wu, B D. Vogt, Vivek Prabhu, Eric K. Lin, Karen Turnquest
Line-edge-roughness (LER) and the relationship to resist processing and materials design is a critical problem for sub-65 nm photolithography. In this work we
Tam H. Duong, David Berning, Allen R. Hefner Jr., Keyue M. Smedley
This paper presents test system developed for long-term stability characterization of 10 kV Silicon Carbide (SiC) power MOSFETs and SiC diodes under 20 kHz hard
Mary F. Theofanos, R J. Michaels, Jean C. Scholtz, Emile L. Morse, Peter May
Interest in the environmental factors that affect biometric image quality is increasing as biometric technologies are currently being implemented in various
Anindita Saha, Hongye Liang, Aldo Badano, Edward F. Kelley
We report on the characterization of two novel probes for measuring display color without contamination from other screen areas or off-normal emissions. The
Angiogenesis is essential to the development, maintenance, and repair of bone tissue, as well as the survival of engineered tissues. Also, since osteoblasts (OB
Erica Takai, Juan M. Taboas, Rocky Tuan, Steven D. Hudson
It is well known that an intimate relationship exists between vascularization and bone formation during development and fracture healing, where new bone
This work evaluates the RF tuning and the microwave nonlinear response of SrTiO 3u thin-films by measuring the third harmonic and third order intermodulation
This lecture was presented at the Workshop on Trapped Ion Quantum Computing hosted by NIST, February 21 - 24, 2006. It discussed the basic principles of fault
P Maciejewski, K Barnard, Rand Swanson, Michael Kehoe, C Smith, Thomas Moon, Robert R. Bousquet, Steven W. Brown, Keith R. Lykke
Deployment of compact hyperspectral imaging sensors on small UAVs has the potential of providing a cost-effective solution for rapid-response target detection
Marina Dobrovolskaia, Hyeong G. Kang, Matthew L. Clarke, Anil Patri, Jeeseong Hwang
Flow cytometry has been instrumental in rapid analysis of single cells since the 1970s. One of the common approaches is the immunofluorescence study involving
Aline Granier, Tinh Nguyen, Naomi Eidelman, Jonathan W. Martin
Carbon nanotubes (CNTs) have a wide range of potential applications due to their unique mechanical properties, high aspect ratios, and electronics structures
Shaw C. Feng, Theodore V. Vorburger, Che B. Joung, Joseph Fu, Ronald G. Dixson, Li Ma
As integrated circuits become smaller and faster, the measurement of line width must have less uncertainty and more versatility. The common requirement for
Historically, business process models refer only to large information sets, and database models and messaging standards provide models of all information about
I Miletic, Marko Vujasinovic, Nenad Ivezic, Zuran Marjanovic
In this paper, we describe results of our work in developing transformation tools that enable use of RDF-based Semantic Mediation tools for integration of