Whitenton, E.
, Ivester, R.
and Heigel, J.
(2007),
A Novel Peak Detection Algorithm for Use in the Study of Machining Chip Segmentation, ISCA Proceedings of the 20th International Conference on Computers and Their Applications in Industry and Engineering (CAINE-2007), November 7-9, 2007, San Francisco, CA, San Francisco, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823018
(Accessed March 24, 2025)