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Many large scale identity management applications require storage and exchange of standardized minutiae templates. Minutia templates offer a more space efficient...
Nanoporous low-dielectric-constant films constitute a class of materials that are plagued by fracture concerns and are not amenable to traditional fracture...
The Standard for the Exchange of Product model data (STEP) [1] contains product information mainly related to geometry. The modeling language used to develop...
Mehmet Sarigecili, Roy Uptal, Sudarsan Rachuri, Ram D. Sriram
ISO 10303 which is STandard for the Exchange of Product model data (STEP) contains a large amount of extremely detailed information. There are no clear and easy...
This paper investigates methods for link quality measurement of an indoor, time-varying wireless link. Link quality estimates are used for a number of higher...
Jan Preusser, Svenja A. Knappe, Vladislav Gerginov, John E. Kitching
A system for sensing magnetic fields is proposed, composed of an array of passive microfabricated alkali atom sensor heads coupled to a control unit using only...
Michael D. Janezic, Uwe Arz, Shelley Begley, Phil Bartley
We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can make...
We discuss the limitations of vector network analyzers in the measurement of nonlinear devices and circuits, including their inability to measure the relative...
In this paper, we propose a backbone construction scheme over heterogeneous ad hoc networks, where the network nodes have different characteristics such as...
Rust and Thijsse have shown that global annual average temperature anomalies T(t i) vary linearly with atmospheric CO 2 concentrations c(t i). The c(t i) can be...
Jack C.P. Cheng, Kincho H. Law, Albert T. Jones, Ram D. Sriram
Supply chain management integrates key business processes and facilities, involving end users and suppliers that provide products, services and information...
Wayne M. Itano, James C. Bergquist, Till P. Rosenband, David J. Wineland, David Hume, Chin-wen Chou, Steven R. Jefferts, Thomas P. Heavner, Tom Parker, Scott Diddams, Tara Fortier
Frequency standards based on narrow optical transitions in 27Al+ and 199Hg+ ions have been developed at NIST. Both standards have absolute reproducibilities of...
Mike Elsbury, Paul D. Dresselhaus, Samuel P. Benz, Zoya Popovic
This paper presents a monolithically-integrated, broadband, lumped-element, symmetrical-hybrid power divider centered at 20 GHz which was designed and...
The number of devices that implement Ethernet interfaces on the factory floor is growing at an exponential rate along with the adoption of industrial-grade...
Richard L. Rhorer, Eric P. Whitenton, Timothy J. Burns, Steven P. Mates, Jarred C. Heigel, April L. Cooke, Johannes A. Soons, Robert W. Ivester
NOTE: This is a two-page abstract for publication in the CD-ROM conference proceedings only. Oral presentation of the complete paper will be presented at the...
Adriaan C. Carter, Solomon I. Woods, Stephen Carr, Timothy M. Jung, Raju V. Datla
Commercially available Absolute Cryogenic Radiometers (ACRs) have combined uncertainties that grow rapidly above 1% at power levels below 10 nW. There are solid...
Yooyoung Lee, P. Jonathon Phillips, Ross J. Micheals
We have successfully implemented a Video-based Automated System for Iris Recognition (VASIR), evaluating its successful performance on the MBGC dataset. The...
Randolph E. Elmquist, George R. Jones, Brian J. Pritchard
The U. S. National Institute of Standards and Technology (NIST) and the National Measurement Institute of Australia (NMIA) have recently examined two types of...
Steven P. Mates, Richard L. Rhorer, Richard Everett, Kirth Simmonds, Amit Bagchi
Measuring the response of soft materials to high strain rate deformation is extremely challenging because of the difficulty of achieving dynamic equilibrium...
Catherine A. Remley, Michael McKinley, J. S. Kenney, M. Myslinski, Galen H. Koepke, Dennis G. Camell, Robert Johnk
In this work, we verify experimentally the consistency of EVM across modulation types of orthogonal frequency-division multiplexed (OFDM) signals in two...
Improving the understanding of the optical scene components associated with coral reef imagery will advance the ability to map and monitor coral reefs using...
Joseph P. Rice, Jorge E. Neira, Michael Kehoe, Rand Swanson
We describe our use of Digital Micromirror Devices (DMDs) for the performance testing, characterization, calibration, and system-level data product validation...
We describe a compressive projection algorithm and quantitatively assess its performance when used with a Hyperspectral Image Projector (HIP). The HIP is being...
There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal...
Gordon A. Shaw, Koo-Hyun Chung, Douglas T. Smith, Jon R. Pratt
The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units...
Christopher L. Holloway, Andrew M. Dienstfrey, Edward E. Kuester
A metafilm (also referred to as a metasurface) is the surface equivalent of a metamaterial. More precisely, a metafilm is a surface distribution of suitably...
Randy Direen, Michael H. Francis, Ronald C. Wittmann
Spherical near-field scanning measurements are used to determine the incident electromagnetic fields within a test volume. Results from two independent...
Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Hai Xu, Barry J. Hershman, Joshua C. Bienfang, David H. Su, Ronald F. Boisvert, Charles W. Clark, Carl J. Williams
A complete fiber-based polarization encoding quantum key distribution (QKD) system based on the BB84 protocol has been developed at National Institute of...
We present a microfabricated atomic force microscope (AFM) cantilever that is used to calibrate AFM friction data. The T-shaped lateral force cantilever is...
We measured in-plane bidirectional-reflectance-distribution-function (BRDF) profiles for specular, haze and Lambertian samples using a converging light beam and...