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Conferences

Machining Process Measurements: A Titanium Machining Example

June 4, 2009

Author(s)

Richard L. Rhorer, Eric P. Whitenton, Timothy J. Burns, Steven P. Mates, Jarred C. Heigel, April L. Cooke, Johannes A. Soons, Robert W. Ivester

NOTE: This is a two-page abstract for publication in the CD-ROM conference proceedings only. Oral presentation of the complete paper will be presented at the...

Absolute Cryogenic Radiometer and Solid State Trap Detectors for IR Power Scales Down to 1 pW with 0.1% Uncertainty

June 2, 2009

Author(s)

Adriaan C. Carter, Solomon I. Woods, Stephen Carr, Timothy M. Jung, Raju V. Datla

Commercially available Absolute Cryogenic Radiometers (ACRs) have combined uncertainties that grow rapidly above 1% at power levels below 10 nW. There are solid...

An Automated Video-Based System For Iris Recognition

June 2, 2009

Author(s)

Yooyoung Lee, P. Jonathon Phillips, Ross J. Micheals

We have successfully implemented a Video-based Automated System for Iris Recognition (VASIR), evaluating its successful performance on the MBGC dataset. The...

Hyperspectral Projection of a Coral Reef Scene using the NIST Hyperspectral Image Projector

June 1, 2009

Author(s)

David W. Allen, Joseph P. Rice, James A. Goodman

Improving the understanding of the optical scene components associated with coral reef imagery will advance the ability to map and monitor coral reefs using...

High Strain Rate Tissue Simulant Measurements Using digital Image Correlation

June 1, 2009

Author(s)

Steven P. Mates, Richard L. Rhorer, Richard Everett, Kirth Simmonds, Amit Bagchi

Measuring the response of soft materials to high strain rate deformation is extremely challenging because of the difficulty of achieving dynamic equilibrium...

Comparison of QPSK and 64QAM EVM for an OFDM WLAN Signal at 2.4 GHz and 4.9 GHz in a Multipath Environment

June 1, 2009

Author(s)

Catherine A. Remley, Michael McKinley, J. S. Kenney, M. Myslinski, Galen H. Koepke, Dennis G. Camell, Robert Johnk

In this work, we verify experimentally the consistency of EVM across modulation types of orthogonal frequency-division multiplexed (OFDM) signals in two...

Transport Behavior and Characterization of Precision 1 (OMEGA) Resistors for International Comparisons

June 1, 2009

Author(s)

Randolph E. Elmquist, George R. Jones, Brian J. Pritchard

The U. S. National Institute of Standards and Technology (NIST) and the National Measurement Institute of Australia (NMIA) have recently examined two types of...

DMD diffraction measurements to support design of projectors for test and evaluation of multispectral and hyperspectral imaging sensors

June 1, 2009

Author(s)

Joseph P. Rice, Jorge E. Neira, Michael Kehoe, Rand Swanson

We describe our use of Digital Micromirror Devices (DMDs) for the performance testing, characterization, calibration, and system-level data product validation...

Hyperspectral Image Compressive Projection Algorithm

June 1, 2009

Author(s)

Joseph P. Rice, Jorge E. Neira, David W. Allen

We describe a compressive projection algorithm and quantitatively assess its performance when used with a Hyperspectral Image Projector (HIP). The HIP is being...

Characterization of Uncertainties When Measuring Metal Cutting Temperatures Using Infrared Radiation Thermography

June 1, 2009

Author(s)

Eric P. Whitenton

There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal...

Quantum Key Distribution System Operating at Sifted-Key Rate Over 4 Mbit/s¹

June 1, 2009

Author(s)

Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Hai Xu, Barry J. Hershman, Joshua C. Bienfang, David H. Su, Ronald F. Boisvert, Charles W. Clark, Carl J. Williams

A complete fiber-based polarization encoding quantum key distribution (QKD) system based on the BB84 protocol has been developed at National Institute of...

Methods for transferring the SI unit of force from millinewtons to piconewtons

June 1, 2009

Author(s)

Gordon A. Shaw, Koo-Hyun Chung, Douglas T. Smith, Jon R. Pratt

The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units...

Near-Field Spherical Scanning: Quiet-Zone Field Evaluation

June 1, 2009

Author(s)

Randy Direen, Michael H. Francis, Ronald C. Wittmann

Spherical near-field scanning measurements are used to determine the incident electromagnetic fields within a test volume. Results from two independent...

Characterization of a Metafilm/Metasurface

June 1, 2009

Author(s)

Christopher L. Holloway, Andrew M. Dienstfrey, Edward E. Kuester

A metafilm (also referred to as a metasurface) is the surface equivalent of a metamaterial. More precisely, a metafilm is a surface distribution of suitably...

Robustness of display reflectance measurements: Comparison between BRDF and hemispherical diffuse reflectance

June 1, 2009

Author(s)

Seungkwan Kim, Edward F. Kelley, John Penczek

We measured in-plane bidirectional-reflectance-distribution-function (BRDF) profiles for specular, haze and Lambertian samples using a converging light beam and...

Torsional spring constant measurement of a T-shaped atomic force microscope cantilever

June 1, 2009

Author(s)

Mark Reitsma, Richard S. Gates, Robert F. Cook

We present a microfabricated atomic force microscope (AFM) cantilever that is used to calibrate AFM friction data. The T-shaped lateral force cantilever is...

Generation of optical Schrödinger cat states by number-resolved squeezed photon subtraction

May 31, 2009

Author(s)

Thomas Gerrits, Scott C. Glancy, Tracy S. Clement, Brice R. Calkins, Adriana E. Lita, Aaron J. Miller, Alan L. Migdall, Sae Woo Nam, Richard P. Mirin, Emanuel H. Knill

We have generated and measured an approximation of an optical Schrödinger cat state by photon subtraction from a squeezed state. Using single-photon avalanche...

Intensity dynamics in a waveguide array laser

May 31, 2009

Author(s)

Mingming M. Feng, Steven T. Cundiff, Kevin L. Silverman, Richard Mirin, Matt Williams, J. Nathan N. Kutz

We report the intensity dynamics of a five-emitter laser array subject to a linearly decreasing injection current. The array produces oscillatory power output...

Extension of the NIST tristimulus colorimeter for solid-state light source measurements

May 29, 2009

Author(s)

George P. Eppeldauer, Carl C. Miller, Thomas C. Larason, Yoshihiro Ohno

In order to obtain improved color measurement uncertainties for solid state light (SSL) sources, the second generation tristimulus colorimeter of NIST has been...

NIST SPECTRALLY TUNABLE LIGHTING FACILITY FOR COLOR RENDERING AND LIGHTING EXPERIMENTS

May 29, 2009

Author(s)

Carl C. Miller, Yoshihiro Ohno, Wendy L. Davis, Yuqin Zong, Kevin Dowling

The National Institute of Standards and Technology has developed a spectrally tunable lighting facility to allow state-of-the-art vision experiments on color...

Standardization Activities for Solid State Lighting in the USA

May 29, 2009

Author(s)

Yoshihiro Ohno

In support of the U.S. Department Energy s Energy Star program for solid state lighting, a series of standards for solid state lighting products have been...

CHARACTERIZATION OF SOLID STATE LIGHTING PRODUCTS FOR MEASUREMENT INTERCOMPARISONS

May 29, 2009

Author(s)

Carl C. Miller

To meet the request of the United States Department of Energy, the National Institute of Standards and Technology and the National Voluntary Laboratory...

Illuminance responsivity calibration of reference photometers at the NIST SIRCUS and SCF facilities

May 29, 2009

Author(s)

George P. Eppeldauer, Carl C. Miller, Thomas C. Larason, Yoshihiro Ohno

The illuminance responsivities of two transfer standard photometers have been directly determined from their spectral responsivity calibrations at two different...

Third- and fourth-order coherences measured with a multi-element superconducting nanowire single-photon detector

May 29, 2009

Author(s)

Martin J. Stevens, Burm Baek, Eric Dauler, Andrew J. Kerman, Richard J. Molnar, Scott A. Hamilton, Karl Berggren, Richard P. Mirin, Sae Woo Nam

We demonstrate a technique for measuring third- and fourth-order coherences using a multi-element detector consisting of four independent, interleaved...

Comparison of interpretability of 1080p30 and 720p60 motion imagery: trade-offs in resolution and frame rate

May 29, 2009

Author(s)

Charles D. Fenimore, James H. Yen, John W. Roberts, Hassan A. Sahibzada

We have conducted an evaluation comparing the interpretability potential of two standardized HD formats, 1080p30 and 720p60. Despite the lack of an existing...

Generating and Using Data of Higher Dimension for Gas-Phase Chemical Sensing

May 29, 2009

Author(s)

Baranidharan Raman, Joshua L. Hertz, Kurt D. Benkstein, Douglas C. Meier, Casey Mungle, Stephen Semancik

Methods to acquire and analyze rich data streams from sensors are helpful, if not required, to track chemical components within complex gas-phase environments...

The TRECVid 2008 BBC Rushes Summarization Evaluation

May 28, 2009

Author(s)

Paul D. Over, Alan Smeaton, George M. Awad

This paper describes an evaluation of automatic video summarization systems run on rushes from several BBC dramatic series. It was carried out under the...

Time and Frequency-Domain Spectroscopy with Dual Frequency Combs

May 28, 2009

Author(s)

Nathan R. Newbury, Ian R. Coddington, William C. Swann

High-resolution spectroscopic measurements of the amplitude and phase spectra from a gas sample can be acquired by use of dual frequency combs. Here we discuss...

Packaging and interconnect technologies for GaN nanowire-based light emitting diodes

May 26, 2009

Author(s)

Norman A. Sanford, Myongjai Lee, Jen-Hau Cheng, Dragos Seghete, Steven M. George, John B. Schlager, Kristine A. Bertness

GaN nanowires grown along c-axis on a silicon substrate using molecular beam epitaxy have been identified as one of the best materials for future light emitting...

Absolute Ranging Using Frequency Combs

May 25, 2009

Author(s)

William C. Swann, Ian R. Coddington, Nathan R. Newbury

We present a technique for measuring absolute range that uses two mismatched frequency combs to measure distance over 1.5 m range with 10 nm level statistical...

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