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We discuss avalanche discrimination in a periodically-gated InGaAs/InP single-photon avalanche diode. We investigate the interrelation between the minimum...
Sara V. Orski, Santanu S. Kundu, Kathryn L. Beers, Richard A. Gross
The enzyme Candida antarctica Lipase B (CAL B), immobilized on a crosslinked poly(methyl methacrylate) (PMMA) support, catalyzes the ring-opening polymerization...
Gregory T. Linteris, Fumiaki Takahashi, Viswanath R. Katta, Oliver Meier
Calculations have been performed for co-flow diffusion flames of propane and a propane-ethanol-water fuel mixture, prescribed for the Federal Aviation...
Sensitive infrared working-standard detectors with large active area are needed to extend the signal dynamic range of the National Institute of Standards and...
Dimensioning and tolerancing standards originated about 75 years ago in the form of various national and company standards that governed engineering draughting...
Secret keys can be established through the use of Quantum channels monitored through classical channels which can be thought of as being error free. Because...
Joy P. Dunkers, Antonio M. Possolo, Thomas V. Lafarge, Beatriz Pateiro-Lopez, Jeffrey Coles, Carl G. Simon Jr.
The physical and chemical properties of a tissue scaffold influences cell response and therefore the success of the resulting tissue construct. Scaffold...
Mehra N. Borazjany, Linbin Yu, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
In this paper we present a case study of applying combinatorial testing to test a combinatorial test generation tool called ACTS. The purpose of this study is...
Kiran Shakya, Tao Xie, Nuo Li, Yu Lei, Raghu N. Kacker, D. Richard Kuhn
Combinatorial Testing (CT) is a systematic way of sampling input parameters of the software under test (SUT). A t-way combinatorial test set can exercise all...
D. Richard Kuhn, James M. Higdon, James F. Lawrence, Raghu N. Kacker, Yu Lei
Many software testing problems involve sequences. This paper presents an application of combinatorial methods to testing problems for which it is important to...
Geometric Dimensioning and tolerance (GD&T) information is created as part of the design process. Today, that process is performed using computer-aided design...
There is a lack of understanding of how structural systems perform under realistic, uncontrolled fires. Current specifications for the design of steel...
In order to maintain the close control of production quality, frequent measurement and process parameter adjustments are desirable. In the discrete parts...
This paper describes a set of demonstrations that illustrate some of the advantages of declarative 3D. Putting descriptions of 3D geometry directly into the DOM...
This paper reports on work in progress on modeling of the effect of packet-level TCP congestion avoidance dynamics on flow-level Internet performance and...
Allowing selfish agents to acquire and exploit system information has both positive and negative effects on the overall performance of resource allocation...
Advanced and intelligent systems within the manufacturing, military, homeland security, and automotive fields are constantly emerging and progressing. Testing...
Sensor nodes in wireless networks often use batteries as their source of energy, but replacing or recharging exhausted batteries in a deployed network can be...
Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it...
Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to...
Ndubuisi G. Orji, Ronald G. Dixson, Andras Vladar, Bin Ming, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental...
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm...
In 2009 NIST developed a U.S. national flow standard to provide traceability for flow meters used for custody transfer of pipeline quality natural gas. NIST...
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Richard M. Silver, Abraham Arceo
Smaller patterning dimensions and novel architectures are fostering research into improved methods of defect detection in semiconductor device manufacturing...
Richard M. Silver, Jing Qin, Bryan M. Barnes, Hui Zhou, Ronald G. Dixson, Francois R. Goasmat
There has been much recent work in developing advanced optical metrology applications that use imaging optics for critical dimension measurements, defect...
Amanda L. Forster, Haruki Kobayashi, Jae H. Kim, Michael A. Riley, Joy Dunkers, Scott Wight, Kirk D. Rice, Gale A. Holmes
The goal of this paper and presentation is to give an overview of the research effort to date being conducted at the National Institute of Standards and...
The nonlinear modal analysis (NMA) methodology for analyzing moment-resisting framed structures is here extended to include frame elements with rigid-end...
Eddy Simoens, Bian Yang, Xuebing Zhou, Filipe Beato, Christoph Busch, Elaine M. Newton, Bart Preneel
Traditional criteria used in biometric performance evaluation do not cover all the performance aspects of biometric template protection (BTP) and the lack of...
This paper describes how modeling and simulation can play a major role in developing standards recommendations for patient compartment layout of automotive...