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Conferences

Evaluation of Proposed Test Artifacts for Five-Axis Machine Tools

Author(s)
Shawn P. Moylan, David Blumenfeld, Michael L. McGlauflin, Ronnie R. Fesperman Jr., M A. Donmez
Machining of a test artifact is an attractive method of evaluating the performance of a machine tool because the tests are often quick and do not require

The Development of an Aerodynamic Shoe Sampling System

Author(s)
Matthew E. Staymates, Jessica M. Grandner, John G. Gillen, Stefan Lukow
In collaboration with the Transportation Security Laboratory, the National Institute of Standards and Technology has been developing a prototype shoe sampling

NON-CONTACT DIMENSIONAL MEASUREMENTS OF BIPOLAR FUEL CELL PLATES

Author(s)
Balasubramanian Muralikrishnan, Wei Ren, Dennis S. Everett, Eric S. Stanfield, Theodore D. Doiron
Non-contact dimensional measurement of fuel cell plates is critical to the eventual rapid manufacture by supporting in-process measurement and control. This

Improvements to A Transportable Atomic Fountain Laser system

Author(s)
Paul D. Kunz, Vladislav Gerginov, Thomas P. Heavner, Steven R. Jefferts
We are developing a transportable rubidium (Rb) atomic fountain frequency standard which uses independently phase-locked diode lasers for laser-cooling. At this

New Improved System for WWVB Broadcast

Author(s)
John P. Lowe, Matthew J. Deutch, Glenn K. Nelson, Douglas D. Sutton, William C. Yates, Peder Hansen, Oren Eliezer, Tom Jung, Stephen Morrison, Yingsi Liang, Dinesh Rajan, Sidharth Balasubramanian, Arun Ramasami, Waleed Khalil
The WWVB broadcast of the time-code signal has not undergone major changes in its communications protocol and modulation scheme since its introduction in 1963

Characterizing Dynamic Effects of Oscillator Power Cycling

Author(s)
David A. Howe, Danielle G. Lirette, Neil Ashby, Archita Hati, Craig W. Nelson
We create a measurement technique and metrics consistent with easy interpretation to be used in development of new oscillators specifically for applications in

Fundamental Limits of Optical Patterned Defect Metrology

Author(s)
Richard M. Silver, Bryan Barnes, Martin Sohn, Hui Zhou, Jing Qin
The semiconductor manufacturing industry is now facing serious challenges in achieving defect detection rates with acceptable throughput and accuracy. With

Uncertainties of Measures in Speaker Recognition Evaluation

Author(s)
Jin Chu Wu, Alvin F. Martin, Craig S. Greenberg, Raghu N. Kacker
The National Institute of Standards and Technology (NIST) Speaker Recognition Evaluations (SRE) are an ongoing series of projects conducted by NIST. In the NIST

Reliability Testing of Advanced Interconnect Materials

Author(s)
Robert R. Keller, Mark C. Strus, Ann C. Chiaramonti Debay, David T. Read, Younglae Kim, Yung J. Jung
We describe the development of electrical test methods to evaluate damage that determines reliability in advanced, small-scale conductors, including damascene

Counting Bugs is Harder Than You Think

Author(s)
Paul E. Black
Software Assurance Metrics And Tool Evaluation (SAMATE) is a broad, inclusive project at the U.S. National Institute of Standards and Technology (NIST) with the

Dual comb-based characterization of rapidly tuned lasers

Author(s)
Fabrizio R. Giorgetta, Esther Baumann, Ian R. Coddington, William C. Swann, Nathan R. Newbury, Zeb W. Barber, Peter Roos
Time-resolved, high-accuracy and high-resolution spectroscopy of rapidly tuned cw lasers is critical to realizing their full potential for sensing, but is not
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