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Conferences

On CD-AFM bias related to probe bending

Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm...

OVERVIEW OF THE TESTING PROGRAM ON FIBERS USED IN BALLISTIC APPLICATIONS

Author(s)
Amanda L. Forster, Haruki Kobayashi, Jae H. Kim, Michael A. Riley, Joy Dunkers, Scott Wight, Kirk D. Rice, Gale A. Holmes
The goal of this paper and presentation is to give an overview of the research effort to date being conducted at the National Institute of Standards and...

Modeling for Optimal Ambulance Patient Compartment Layout

Author(s)
Deogratias Kibira, Yung-Tsun Lee, Mehdi Dadfarnia
This paper describes how modeling and simulation can play a major role in developing standards recommendations for patient compartment layout of automotive...

Modeling for Optimal Ambulance Patient Compartment Layout

Author(s)
Deogratias Kibira, Yung-Tsun T. Lee, Mehdi Dadfarnia
This paper describes how modeling and simulation can play a major role in developing standards recommendations for patient compartment layout of automotive...

SEM imaging of ultra-high aspect ratio hole features

Author(s)
John S. Villarrubia, Aron Cepler, Benjamin D. Bunday, Bradley Thiel
In-line, non-destructive process control metrology of high aspect ratio (HAR) holes and trenches has long been a known gap in metrology. Imaging the bottoms of...

In Situ Raman Monitoring of Ring-Opening Copolymerizations

Author(s)
Matthew T. Hunley, Santanu S. Kundu, Peter M. Johnson, Kathryn Beers
Recent advances in enzyme, metal, and organic catalysts have enabled the development of advanced functional polymers from cyclic ester and cyclic carbonate...

Improved Indifferentiability Security Bound for the JH Mode

Author(s)
Dustin Moody, Souradyuti Paul, Daniel C. Smith-Tone
The JH hash function is one of the five fi nalists of the ongoing NIST SHA3 hash function competition. Despite several earlier attempts, and years of analysis...

Functional Requirements of a Model for Kitting Plans

Author(s)
Stephen B. Balakirsky, Zeid Kootbally, Thomas R. Kramer, Rajmohan Madhavan, Craig I. Schlenoff, Michael O. Shneier
Industrial assembly of manufactured products is often performed by first bringing parts together in a kit and then moving the kit to the assembly area where the...

Infrared detector calibrations

Author(s)
George P. Eppeldauer, Vyacheslav B. Podobedov
An InSb working standard radiometer, first calibrated at NIST in 1999 against a cryogenic bolometer, was recently calibrated against a newly developed low-NEP...

Emergency Response Robot Evaluation Exercise

Author(s)
Adam S. Jacoff, Hui-Min Huang, Ann Virts, Anthony Downs, Raymond Sheh
More than 60 robot test methods are being developed by a team lead by the National Institute of Standards and Technology (NIST) with the sponsorship of U.S...
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