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As the National Metrology Institute (NMI) for the United States, NIST, formerly the National Bureau of Standards, has provided measurement services, both...
Samuel L. Manzello, Sayaka Suzuki, Yoshihiko Hayashi
Firebrands are a critical mechanism of fire spread in large outdoor fires, such as urban fires in Japan and WUI fires in Australia, Southern Europe, and the USA...
Samuel L. Manzello, Sayaka Suzuki, Yoshihiko Hayashi
Fires in the wildland-urban interface (WUI) have been a large problem not only in the USA, but all over the world. From a pragmatic point of view, the WUI fire...
In WUI fires, decking assemblies have been observed to be an ignition vulnerability based on post-fire damage surveys. The Office of the State Fire Marshall...
Evidence suggests that wind driven firebrand showers are a major cause of structural ignition in Wildland-Urban Interface (WUI) fires. While firebrands have...
Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of...
The new paradigm of performance-based fire engineering (PBFE), with its systematic approach to identifying building performance objectives, quantitative...
Roger V. Bostelman, Richard J. Norcross, Joseph A. Falco, Jeremy A. Marvel
The National Institute of Standards and Technology (NIST) has been researching human-robot/vehicle collaborative environments for automated guided vehicles...
This paper considers the robustness of prototype 10-story steel moment-frame and braced-frame buildings. Reduced modeling approaches are presented for steel...
The value and impact of demand response (DR) at grid-scale depends upon the widespread and active participation of a diverse customer base. The level of...
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device...
Because of their importance to infrastructure, a number of studies have examined the structural properties of power grids and have proposed random topological...
Oliver T. Slattery, Lijun Ma, Paulina Kuo, Yong-Su Kim, Xiao Tang
A tunable waveguide-based frequency up-conversion detector is used for single photon level near infrared (IR) spectroscopic measurements. Applications include...
P J. Phillips, Yi-Chen Chen, Vishal M. Patel, Sumit Shekar, Rama Chellappa
In video-based face recognition, a key challenge is in exploiting the extra information available in a video; e.g., face, body, and motion identity cues. In...
Our measurements reveal that, similar to much larger power device geometries, hot carrier degradation in ultra-short channel devices involves (1) presumably...
Sumona Sarkar, Carl G. Simon Jr., Roberta I. Lock, Joy P. Dunkers
To develop tissue engineered devices for regenerative medicine strategies, key scaffold properties for directing stem cell response must be identified. As focus...
Paul W. Witherell, Katherine C. Morris, Anantha Narayanan Narayanan, Jae H. Lee, Sudarsan Rachuri
The synthesis of material information across lifecycle stages will lay the foundation for a material information model to support sustainable decision making...
At the present time, there is a lack of understanding of the performance of structures as complete systems under extreme loading conditions such as realistic...
CIE 191:2010 recommends a mesopic photometry system that defines the spectral luminous efficiency function for peripheral visual tasks. For implementation of...
Christophe Martinsons, Yuqin Zong, C Cameron Miller, Yoshi Ohno
Specific issues appear in the measurement of the electrical power of AC-powered LED lamps and luminaires because they often generate harmonic currents in a wide...
Deogratias Kibira, Yung-Tsun T. Lee, Allison Barnard Feeney, Jennifer L. Marshall, Larry Avery, Jennifer Moore, Carlotta Boone
Emergency medical service providers riding in ambulance patient compartments, while caring for patients, are at high risk of suffering injuries in case of a...
Bryan M. Barnes, Francois R. Goasmat, Martin Y. Sohn, Hui Zhou, Abraham Arceo
To measure the new SEMATECH 9 nm node Intentional Defect Array (IDA) and subsequent small, complex defects, a methodology has been used to exploit the rich...
Benjamin D. Bunday, Thomas Germer, Victor H. Vartanian, Aaron Cordes, Aron Cepler, Charles Settens
This paper will examine the future for critical dimension (CD) metrology. First we will present the extensive list of applications for which CD metrology...
Wireless sensor networks are being considered for application within buildings to control various equipment in different working environments. As wireless...
P J. Phillips, Yi-Chen Chen, Vishal M. Patel, Jaishanker K. Pillai, Rama Chellappa
We propose a novel dictionary-based learning method for ambiguously labeled multiclass classification, where each training sample has multiple labels and only...
We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering...
Regis J. Kline, Daniel F. Sunday, Chengqing C. Wang, Wen-Li Wu, Charlie Settens, Bunday Benjamin, Brad Thiel, Matyi Richard
Critical dimension small angle X-ray scattering (CD-SAXS) has been identified as a potential solution for measurement of nanoscale lithographic features by...
Paul Lemaillet, Thomas Germer, Regis J. Kline, Daniel Sunday, Chengqing C. Wang, Wen-Li Wu
In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD)...
David R. Novotny, Josh Gordon, Jason Coder, Michael Francis, Jeffrey R. Guerrieri
The Antenna Metrology Laboratory at the National Institute of Standards and Technology, USA (NIST) is developing a robotically controlled near-field pattern...