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Conferences

Robustness of Prototype Steel Frame Buildings against Column Loss: Assessment and Comparisons

May 2, 2013

Author(s)

Joseph A. Main, Judy Liu

This paper considers the robustness of prototype 10-story steel moment-frame and braced-frame buildings. Reduced modeling approaches are presented for steel...

Towards Demand Response Measurement and Verification Standards

May 1, 2013

Author(s)

David G. Holmberg, David Hardin, Ed Koch

The value and impact of demand response (DR) at grid-scale depends upon the widespread and active participation of a diverse customer base. The level of...

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013

Author(s)

Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen

Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale...

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013

Author(s)

Ravikiran Attota, Abraham Arceo, Bunday Benjamin

In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device...

Limits in Modeling Power Grid Topology

April 29, 2013

Author(s)

Brian D. Cloteaux

Because of their importance to infrastructure, a number of studies have examined the structural properties of power grids and have proposed random topological...

Tunable up-conversion detector for single photon and bi-photon near-infrared spectroscopic applications

April 29, 2013

Author(s)

Oliver T. Slattery, Lijun Ma, Paulina Kuo, Yong-Su Kim, Xiao Tang

A tunable waveguide-based frequency up-conversion detector is used for single photon level near infrared (IR) spectroscopic measurements. Applications include...

Video-based Face Recognition via Joint Sparse Representation

April 26, 2013

Author(s)

P J. Phillips, Yi-Chen Chen, Vishal M. Patel, Sumit Shekar, Rama Chellappa

In video-based face recognition, a key challenge is in exploiting the extra information available in a video; e.g., face, body, and motion identity cues. In...

The Series Resistance Component of Hot Carrier Degradation in Ultra-Short Channel Devices

April 22, 2013

Author(s)

Jason P. Campbell, Kin P. Cheung, Anthony Oates

Our measurements reveal that, similar to much larger power device geometries, hot carrier degradation in ultra-short channel devices involves (1) presumably...

Effect of Surface Chemistry on Stem Cell Response in 2-D vs. 3-D Cell Culture Niches

April 19, 2013

Author(s)

Sumona Sarkar, Carl G. Simon Jr., Roberta I. Lock, Joy P. Dunkers

To develop tissue engineered devices for regenerative medicine strategies, key scaffold properties for directing stem cell response must be identified. As focus...

Sustainability through Lifecycle Synthesis of Material Information

April 19, 2013

Author(s)

Paul W. Witherell, Katherine C. Morris, Anantha Narayanan Narayanan, Jae H. Lee, Sudarsan Rachuri

The synthesis of material information across lifecycle stages will lay the foundation for a material information model to support sustainable decision making...

Performance of Steel Shear Tab Connections at Elevated Temperatures

April 16, 2013

Author(s)

Mina S. Seif, Joseph Main, Therese P. McAllister

At the present time, there is a lack of understanding of the performance of structures as complete systems under extreme loading conditions such as realistic...

EFFECT OF HIGH LUMINANCE SOURCES TO PERIPHERAL ADAPTATION STATE IN MESOPIC RANGE

April 15, 2013

Author(s)

Tatsukiyo (. Uchida, Yoshihiro Ohno

CIE 191:2010 recommends a mesopic photometry system that defines the spectral luminous efficiency function for peripheral visual tasks. For implementation of...

INFLUENCE OF CURRENT AND VOLTAGE HARMONIC DISTORTION ON THE POWER MEASUREMENT OF LED LAMPS AND LUMINAIRES

April 15, 2013

Author(s)

Christophe Martinsons, Yuqin Zong, C Cameron Miller, Yoshi Ohno

Specific issues appear in the measurement of the electrical power of AC-powered LED lamps and luminaires because they often generate harmonic currents in a wide...

Modeling and Simulation for Improving Ambulance Patient Compartment Design Standards

April 12, 2013

Author(s)

Deogratias Kibira, Yung-Tsun T. Lee, Allison Barnard Feeney, Jennifer L. Marshall, Larry Avery, Jennifer Moore, Carlotta Boone

Emergency medical service providers riding in ambulance patient compartments, while caring for patients, are at high risk of suffering injuries in case of a...

Enhancing 9 nm Node Dense Patterned Defect Optical Inspection using Polarization, Angle, and Focus

April 10, 2013

Author(s)

Bryan M. Barnes, Francois R. Goasmat, Martin Y. Sohn, Hui Zhou, Abraham Arceo

To measure the new SEMATECH 9 nm node Intentional Defect Array (IDA) and subsequent small, complex defects, a methodology has been used to exploit the rich...

Experimental Study of the Thermal Impacts on Wireless Sensor Batteries

April 10, 2013

Author(s)

Wenqi Guo, William M. Healy, Mengchu Zhou

Wireless sensor networks are being considered for application within buildings to control various equipment in different working environments. As wireless...

Gaps Analysis for CD Metrology Beyond the 22 nm Node

April 10, 2013

Author(s)

Benjamin D. Bunday, Thomas Germer, Victor H. Vartanian, Aaron Cordes, Aron Cepler, Charles Settens

This paper will examine the future for critical dimension (CD) metrology. First we will present the extensive list of applications for which CD metrology...

Dictionary Learning from Ambiguously Labeled Data

April 9, 2013

Author(s)

P J. Phillips, Yi-Chen Chen, Vishal M. Patel, Jaishanker K. Pillai, Rama Chellappa

We propose a novel dictionary-based learning method for ambiguously labeled multiclass classification, where each training sample has multiple labels and only...

Critical Dimension small angel X-ray scattering measurements of FinFET and 3D memory structures

April 8, 2013

Author(s)

Regis J. Kline, Daniel F. Sunday, Chengqing C. Wang, Wen-Li Wu, Charlie Settens, Bunday Benjamin, Brad Thiel, Matyi Richard

Critical dimension small angle X-ray scattering (CD-SAXS) has been identified as a potential solution for measurement of nanoscale lithographic features by...

Estimating Uncertainties in Antenna Measurements

April 8, 2013

Author(s)

Michael H. Francis

We describe general methods of estimating uncertainties in antenna measurements. These include estimates based on theory (analysis1), simulation, and altering...

Intercomparison between optical and x-ray scatterometry measurements of FinFET structures

April 8, 2013

Author(s)

Paul Lemaillet, Thomas Germer, Regis J. Kline, Daniel Sunday, Chengqing C. Wang, Wen-Li Wu

In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD)...

Performance Evaluation of a Robotically Controlled Millimeter-Wave Near-Field Pattern Range At the NIST

April 7, 2013

Author(s)

David R. Novotny, Josh Gordon, Jason Coder, Michael Francis, Jeffrey R. Guerrieri

The Antenna Metrology Laboratory at the National Institute of Standards and Technology, USA (NIST) is developing a robotically controlled near-field pattern...

Modeling Scanning Electron Microscope Measurements with Charging

April 3, 2013

Author(s)

John S. Villarrubia

A Basic CWE-121 Buffer Overflow Effectiveness Test Suite

April 1, 2013

Author(s)

Paul E. Black, Hsiao-Ming M. Koo, Thomas F. Irish

Phase 3 of MITRE's Common Weakness Enumeration (CWE) Compatibility and Effectiveness program allows a customer to understand how effective a software assurance...

The evaluation of photo/e-beam complementary grayscale lithography for high topography 3D structure

March 29, 2013

Author(s)

Liya Yu, Richard J. Kasica, Robert D. Newby, Lei Chen, Vincent K. Luciani

This article demonstrates and evaluates photo/e-beam grayscale complementary lithography processes for the fabrication of large area, high topography grayscale...

Metrology For Organic Monolayers On Cobalt Surfaces

March 27, 2013

Author(s)

Sujitra J. Pookpanratana, Leigh K. Lydecker, Hyuk-Jae Jang, Curt A. Richter, Christina A. Hacker

Computational Fluid Dynamic (CFD) Investigation of NISTs Scale Model Smokestack Simulator

March 27, 2013

Author(s)

Aaron N. Johnson, Jacob E. Ricker, Joey T. Boyd

Accurate flow measurements are essential to quantifying the amount of greenhouse gases (GHGs) and other pollutants emitted from the smokestacks of coal-fired...

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013

Author(s)

Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler

This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures...

Developing Standards for Commercial Electric Vehicle Fueling and Submetering

March 27, 2013

Author(s)

Marc A. Buttler

NIST plays a role in the development of standards for commercial measuring systems that are used in legal metrology in the U.S. NIST Handbook 130 and NIST...

Frontiers of Characterization and Metrology for Nanoelectronics: 2013

March 26, 2013

Author(s)

Erik M. Secula, David G. Seiler

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