Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Comparison of Power Ratio and Vector Network Analyzer Techniques for Measuring Attenuation

Published

Author(s)

Caitlin Chirgwin, Thomas P. Crowley, Weihai Fang, Denis X. LeGolvan

Abstract

By using a power ratio technique, we have lowered our uncertainty for attenuation measurements by a factor of about 4 (typical) when compared to our vector network analyzer uncertainty analysis. The power ratio technique is applicable to insertable 2-port devices with low reflection coefficients such as airlines and attenuators. The method is illustrated with 3 coaxial devices over a frequency range of 2-18 GHz and 2 rectangular waveguide devices over a frequency range of 50-75 GHz. Our results suggest that a significantly lower attenuation uncertainty could be justified by a re-analysis of the vector network analyzer measurements.
Proceedings Title
Proceedings of the 80th Automatic Radio Frequency Techniques Group (ARFTG) Microwave Measurement Conference
Conference Dates
November 29-30, 2012
Conference Location
San Diego, CA, US

Keywords

scattering parameters, vector network analyzer, microwave measurements, microwave power

Citation

Chirgwin, C. , Crowley, T. , Fang, W. and LeGolvan, D. (2012), Comparison of Power Ratio and Vector Network Analyzer Techniques for Measuring Attenuation, Proceedings of the 80th Automatic Radio Frequency Techniques Group (ARFTG) Microwave Measurement Conference, San Diego, CA, US, [online], https://doi.org/10.1109/ARFTG.2012.6422438, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912694 (Accessed June 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 29, 2012, Updated October 12, 2021