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Books

High Resolution Optical Spectroscopy in the UV, ed. by A.B. Myers and T.R. Rizzo

January 1, 1995

Author(s)

W A. Majewski, J F. Pfanstiel, David F. Plusquellic, David W. Pratt

A Guide/Antiguide Structure for Implementing Self-imaging Waveguide Beamsplitters

January 1, 1995

Author(s)

T J. Tayag, Garnett W. Bryant

Magneto-Transport Properties of HgCdTe, EMIS Data Reviews

December 31, 1994

Author(s)

J R. Lowney, Jin S. Kim, David G. Seiler

Optical Properties of Semiconductors

December 31, 1994

Author(s)

Paul M. Amirtharaj, David G. Seiler

Physics for Device Simulations and Its Verification by Measurements

December 31, 1994

Author(s)

Herbert S. Bennett, J R. Lowney

Cryogenic Precision Capacitance Bridge Using a Single Electron Tunneling Electrometer

December 31, 1994

Author(s)

R. N. Ghosh, Alan F. Clark, B. A. Sanborn, Edwin R. Williams

Microelectronic Test Structures for Feature Placement and Electrical Linewidth Metrology

December 31, 1994

Author(s)

Loren W. Linholm, Richard A. Allen, Michael W. Cresswell

The Materials Dosimetry Reference Facility, ed. by H. Farrar IV, E.P. Lippincott, J.G. Williams, and D.W. Vehar

December 1, 1994

Author(s)

A I. Hawari, R Venkataraman, R Fleming, C M. Eisenhauer, J A. Grundl, D Mcgarry

Accuracy in Integrated Circuit Dimensional Measurements

December 1, 1994

Author(s)

James E. Potzick

The measurement of critical dimensions of features on integrated circuits and photomasks is modeled as the comparison of the images of the test object and of a

Parameters Characterizing a Critical Dimension Measurement

December 1, 1994

Author(s)

Robert D. Larrabee, Michael T. Postek

There are a number of parameters used to characterize a measurement result for the purposes of specifying its value for the intended purpose. Precision

Optical Characterization in Microelectronics Manufacturing

September 1, 1994

Author(s)

S. Perkowitz, David G. Seiler

Comparison of Selectivities for a Series of Cyanobiphenyl Stationary Phases

June 1, 1994

Author(s)

B. R. Hillery, J. E. Girard, Michele M. Schantz, Stephen Wise

Quantitative Analysis of Selected PCB Congeners in Marine Matrix Reference Materials

June 1, 1994

Author(s)

B. R. Hillery, J. E. Girard, Michele M. Schantz, Stephen Wise

NIST Hearing Aid Test Procedures and Test Data

March 1, 1994

Author(s)

Randall P. Wagner, E D. Burnett

A description is given of the hearing aid testing done for the Department of Veterans Affairs. Emphasis is given to the determination of the insertion frequency

Tunneling Spectroscopy of Thallium-Based High-Temperature Superconductors

January 1, 1994

Author(s)

John M. Moreland, J. A. Aust

High resolution IR studies of polymolecular clusters: micromatrices and unimolecular ring opening, ed. by J. Jortner et al.

January 1, 1994

Author(s)

David J. Nesbitt

Supernova Remnants

January 1, 1994

Author(s)

T A. Lozinskaya, M A. Dopita

Developments in stellar coronae 1991-1993, Report

January 1, 1994

Author(s)

J L. Linsky

Stellar coronal structures, ed. by V. Rusin, P. Heinzel, and J.-C. Vial

January 1, 1994

Author(s)

J L. Linsky

Deuterium in the Local Interstellar Medium: Its cosmological significance, ed. by W. Wamsteker

January 1, 1994

Author(s)

J L. Linsky, A Diplas, B D. Savage, C Andrulis, A Brown

Quantum Mechanics with One, Two, and Many Atoms

January 1, 1994

Author(s)

Wayne M. Itano, James C. Bergquist, John J. Bollinger, David J. Wineland

Laser-Cooled Trapped Ion Experiments at NIST

January 1, 1994

Author(s)

Joseph N. Tan, John J. Bollinger, A S. Barton, David J. Wineland

Radiation Process Data Collection, Analysis, and Interpretation, ed. by R.F. Morrissey

January 1, 1994

Author(s)

M C. Saylor, S W. Baryschpolec, L M. Huroitz, W L. Mclaughlin

Neutron Leakage Benchmarks for Water Moderators, ed. by H. Farrar IV, E.P. Lippincott, J.G. Williams, and D.W. Vehar

January 1, 1994

Author(s)

David M. Gilliam, J F. Briesmeister

Monte Carlo and Analytic Methods in the Transport of Electrons, Neutrons, and Alpha Particles, ed. by A. Chatterjee and M.N. Varma

January 1, 1994

Author(s)

Randall S. Caswell, Stephen M. Seltzer

Measurements of the ²³⁷Np(n,f) Cross Section, ed. by H. Farrar IV, E.P. Lippincott, J.G. Williams, and D.W. Vehar

January 1, 1994

Author(s)

Allan D. Carlson, W E. Parker, P W. Lisowski, G L. Morgan, S J. Seestrom, N W. Hill, K Meggers

Atomic Transition Probabilities

January 1, 1994

Author(s)

Wolfgang L. Wiese, Working group 2:

Dual Ion Beam Assisted Deposition for Multilayer Production

January 1, 1994

Author(s)

J Pedulla, A Bartos, R Deslattes

Towards Improved Form Factor Tables, eds. G. Materlik, C.J. Sparks and K. Fischer

January 1, 1994

Author(s)

Christopher T. Chantler

A Methodology for Systematic Generation and Evaluation of Alternative Operation Plans

January 1, 1994

Author(s)

Satyandra K. Gupta, William Regli, D Nau, Li Zhang

This chapter describes a methodology for analyzing some of the manufacturability aspects of machined parts during the design stage of the product development

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