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Books

A Guide/Antiguide Structure for Implementing Self-imaging Waveguide Beamsplitters

January 1, 1995

Author(s)

T J. Tayag, Garnett W. Bryant

Pitch Diameter Measurement of Threaded Gages Using a CMM

January 1, 1995

Author(s)

Ralph C. Veale, Edgar G. Erber, Bruce R. Borchardt

The reference datum for a screw thread is the pitch diameter cylinder. Although a defined method within the United states for pitch diameter measurement exists...

Fabrication of Optics by Diamond Turning

January 1, 1995

Author(s)

Richard L. Rhorer, Christopher J. Evans

The use of special machine tools with single-crystal diamond-cutting tools to produce metal optics is called diamond turning. The manufacture of optical...

Magnetooptic Effects

January 1, 1995

Author(s)

M. N. Deeter, Gordon W. Day, Allen Rose

Magneto-Transport Properties of HgCdTe, EMIS Data Reviews

December 31, 1994

Author(s)

J R. Lowney, Jin S. Kim, David G. Seiler

Optical Properties of Semiconductors

December 31, 1994

Author(s)

Paul M. Amirtharaj, David G. Seiler

Physics for Device Simulations and Its Verification by Measurements

December 31, 1994

Author(s)

Herbert S. Bennett, J R. Lowney

Cryogenic Precision Capacitance Bridge Using a Single Electron Tunneling Electrometer

December 31, 1994

Author(s)

R. N. Ghosh, Alan F. Clark, B. A. Sanborn, Edwin R. Williams

Microelectronic Test Structures for Feature Placement and Electrical Linewidth Metrology

December 31, 1994

Author(s)

Loren W. Linholm, Richard A. Allen, Michael W. Cresswell

The Materials Dosimetry Reference Facility, ed. by H. Farrar IV, E.P. Lippincott, J.G. Williams, and D.W. Vehar

December 1, 1994

Author(s)

A I. Hawari, R Venkataraman, R Fleming, C M. Eisenhauer, J A. Grundl, D Mcgarry

Accuracy in Integrated Circuit Dimensional Measurements

December 1, 1994

Author(s)

James E. Potzick

The measurement of critical dimensions of features on integrated circuits and photomasks is modeled as the comparison of the images of the test object and of a...

Parameters Characterizing a Critical Dimension Measurement

December 1, 1994

Author(s)

Robert D. Larrabee, Michael T. Postek

There are a number of parameters used to characterize a measurement result for the purposes of specifying its value for the intended purpose. Precision...

Optical Characterization in Microelectronics Manufacturing

September 1, 1994

Author(s)

S. Perkowitz, David G. Seiler

Comparison of Selectivities for a Series of Cyanobiphenyl Stationary Phases

June 1, 1994

Author(s)

B. R. Hillery, J. E. Girard, Michele M. Schantz, Stephen Wise

Quantitative Analysis of Selected PCB Congeners in Marine Matrix Reference Materials

June 1, 1994

Author(s)

B. R. Hillery, J. E. Girard, Michele M. Schantz, Stephen Wise

NIST Hearing Aid Test Procedures and Test Data

March 1, 1994

Author(s)

Randall P. Wagner, E D. Burnett

A description is given of the hearing aid testing done for the Department of Veterans Affairs. Emphasis is given to the determination of the insertion frequency...

A Methodology for Systematic Generation and Evaluation of Alternative Operation Plans

January 1, 1994

Author(s)

Satyandra K. Gupta, William Regli, D Nau, Li Zhang

This chapter describes a methodology for analyzing some of the manufacturability aspects of machined parts during the design stage of the product development...