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General Laser Measurements

The Applied Physics Division conducts research on a variety of problems in the characterization of optoelectronics components. Consequently, we are interested in discussing and supporting all measurements involving laser detectors, sources, components, and instrumentation. Examples of measurement areas include beam profile, optical density or attenuation, and detector linearity. We also support instrumentation used with optical fiber power systems offering various optical fiber power related measurements upon request and by prearrangement. These include optical attenuator characterization, high power measurements, and power meter measurements involving unusual connector or fiber types. Please contact matthew.spidell [at] nist.gov (Matthew Spidell )for additional information.

Description Wavelength Parameter Documentation Contact
Detector Linearity  10.6 μm   NIST 2004  joshua.hadler [at] nist.gov (Josh Hadler) 
1.07 μm
248 nm
193 nm
Optical Fiber Power Meter Linearity  850, 980, 1300, 1480, and 1550 nm -90 to 0 dBm AO 2005  igor.vayshenker [at] nist.gov (Igor Vayshenker) 
980 and 1480 nm 0 to 30 dBm
Optical Detector Spatial Uniformity 635, 850, 1300, 1550 nm   NCSL 1994 david.livigni [at] nist.gov (David Livigni)
Spectral Responsivity of Laser and Optical Fiber Power Meters 400 - 1700 nm 10 - 100 µW SP250-53 joshua.hadler [at] nist.gov (Josh Hadler)
Created September 21, 2010, Updated May 22, 2018