The Applied Physics Division conducts research on a variety of problems in the characterization of optoelectronics components. Consequently, we are interested in discussing and supporting all measurements involving laser detectors, sources, components, and instrumentation. Examples of measurement areas include beam profile, optical density or attenuation, and detector linearity. We also support instrumentation used with optical fiber power systems offering various optical fiber power related measurements upon request and by prearrangement. These include optical attenuator characterization, high power measurements, and power meter measurements involving unusual connector or fiber types. Please contact matthew.spidell [at] nist.gov (Matthew Spidell )for additional information.
|Detector Linearity||10.6 μm||NIST 2004||joshua.hadler [at] nist.gov (Josh Hadler)|
|Optical Fiber Power Meter Linearity||850, 980, 1300, 1480, and 1550 nm||-90 to 0 dBm||AO 2005||igor.vayshenker [at] nist.gov (Igor Vayshenker)|
|980 and 1480 nm||0 to 30 dBm|
|Optical Detector Spatial Uniformity||635, 850, 1300, 1550 nm||NCSL 1994||david.livigni [at] nist.gov (David Livigni)|
|Spectral Responsivity of Laser and Optical Fiber Power Meters||400 - 1700 nm||10 - 100 µW||SP250-53||joshua.hadler [at] nist.gov (Josh Hadler)|