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Erik M. Secula
Supervisory Executive Management Specialist
Mr. Secula is the Supervisory Executive Management Specialist of the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). Since joining NIST in 1998, Mr. Secula has provided technical information to the semiconductor industry through the marketing of the Division's programs and the management of the technology transfer processes within the Division and Laboratory. He is responsible for editing all technical documents and papers from his Division. Major activities include developing web pages, developing and maintaining numerous databases, strategic planning, serving as the Division's safety representative, and serving as the publications coordinator for the recent Frontiers of Characterization and Metrology for Nanoelectronics conferences.
