Journal of Research (NIST JRES)

A Double-Primary Dead-Weight Tester for Pressures (35-175) kPa in Gage Mode

February 1, 2003

Author(s)

K. Jain, Y Q. Cen, Walter J. Bowers Jr., James W. Schmidt

Primary pressure standards in the atmospheric pressure range are often established using mercury manometers. Less frequently, controlled-clearance dead-weight

Potassium Bromate Assay by Redox Titrimetry Using Arsenic Trioxide

February 1, 2003

Author(s)

J M. Smeller, Stefan D. Leigh

Bromate, a disinfectant, is one of the analytes of interest in wastewater analysis. Environmental laboratories have a regulatory need for their measurements to

Statistical Interpretation of Key Comparison Reference Value, Degrees of Equivalence, and Their Associated Uncertainties

January 1, 2003

Author(s)

Raju V. Datla, R Kacker, Albert C. Parr

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

January 1, 2003

Author(s)

Simon G. Kaplan, R Gupta

Optical Diffraction in Close Proximity to Plane Apertures. II. Comparison of Half-Plane Diffraction Theories

January 1, 2003

Author(s)

Klaus Mielenz

The accuracy and physical significance of the classical Rayleigh-Sommerfield and Kirchhoff diffraction integrals are assessed in the context of Sommerfield s

Mass Absorption Coefficient of Tungsten and Tantalum, 1450 eV to 2350 eV: Experiment, Theory, and Application

January 1, 2003

Author(s)

Zachary H. Levine, S Grantham, Charles S. Tarrio, D Paterson, I McNulty, T M. Levin, A L. Ankudinov, J J. Rehr

The mass absorption coefficient of tungsten and tantalum was measured with soft x-ray photons from 1450 eV to 2350 eV using an undulator source. This includes

Mass Absorption Coefficient of Tungsten and Tantalum,1450 eV to 2350 eV: Experiment, Theory, and Application

January 1, 2003

Author(s)

Zachary H. Levine, S Grantham, Charles S. Tarrio, D Patterson, I McNulty, T M. Levin, A L. Ankudinov, J J. Rehr

Summary of the WERB approved article Mass Absorption Coefficient of Tungsten and Tantalum, 1450 to 2350 eV: Experiment, Theory, and Application by myself and 7

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002

Author(s)

Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright

Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

December 1, 2002

Author(s)

Dale E. Newbury

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy less than or equal to 5 keV, can achieve spatial resolution, laterally

X-Ray Microanalyses in the Variable Pressure (Environmental) Scanning Electron Microscopy

December 1, 2002

Author(s)

Dale E. Newbury

X-ray spectra measured on uncoated insulators in the low voltage scanning electron microscope (LVSEM) and the variable pressure environmental scanning electron

Uncertainty in Quantitative Electron Probe Microanalysis

December 1, 2002

Author(s)

K F. Heinrich

Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard Collection

December 1, 2002

Author(s)

E P. Vincenzi, S Eggins, A Logan, R Wysoczanski

Decomposition of Wavelength Dispersive X-Ray Spectra

December 1, 2002

Author(s)

G Remond, Robert L. Myklebust, M Fialin, C Nockolds, M Phillips, C Roques-Carmes

X-Ray Microanalyses in the Variable Pressure (Environmental) Scanning Electron Microscope

November 1, 2002

Author(s)

Dale E. Newbury

Electron-excited x-ray microanalysis performed in the variable pressure and environmental scanning electron microscopes is subject to additional artifacts

The Analysis of Particles at Low Accelerating Voltages (

November 1, 2002

Author(s)

John A. Small

In recent years, there have been a series of advancements in electron beam instruments and x-ray detectors which may make it possible to improve significantly

Lattice Matching (LM)-Prevention of Inadvertent Duplicate Publications of Crystal Structures

October 1, 2002

Author(s)

Alan D. Mighell

Lattice-matching techniques have proved to be an extremely effective for the identification of unknown crystalline materials. A commonly employed lattice

Three Improvements in Reduction and Computation of Elliptic Integrals

October 1, 2002

Author(s)

B C. Carlson

Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility

October 1, 2002

Author(s)

Uwe Arp

A method to include the influence of the vertical electron beam emittance onto the calculability of synchrotron radiation is introduced. It accounts for the

Noise-Parameter Uncertainties: A Monte Carlo Simulation

October 1, 2002

Author(s)

James P. Randa

This paper reports the formulation and results of a Monte Carlo study of uncertainties in noise-parameter measurements. The simulator permits the computation of

Self-Similarity Simplification Approaches for the Modeling and Analysis of Rockwell Hardness Indention

September 1, 2002

Author(s)

Li Ma, J Zhou, A Lau, Samuel R. Low III, Roland deWit

Indentation process of the Rockwell diamond indenter pressing into inelastic material is studies for the analysis, simulation and prediction of Rockwell

Transient Green's Tensor for a Layered Solid Half-Space With Different Interface Conditions

September 1, 2002

Author(s)

S C. Ren, Nelson N. Hsu, Donald G. Eitzen

Pulsed ultrasonic techniques can be and have been used to examine the interface conditions of a bonded structure. To provide a theoretical base for such testing

Conventional Cells--The Last Step Toward General Acceptance of Standard Conventional Cells for the Reporting of Crystallographic Data

August 1, 2002

Author(s)

Alan D. Mighell

The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of

Development of a Tunable LED-Based Colorimetric Source

August 1, 2002

Author(s)

Steven W. Brown, C Santana, George P. Eppeldauer

A novel, spectrally tunable light-source utilizing light emitting diodes (LED's) for radiometric, photometric, and colorimetric applications is described. The

Diffractive Optics From Self-Assembled DNA

August 1, 2002

Author(s)

Zachary H. Levine

An algorithm is presented for assembling tiles into a variable spaced grating, the one-dimensional analogue of Fresnel zone plate. The algorithm supports

Photoassociation in a Bose-Einstein Condensate

August 1, 2002

Author(s)

Paul D. Lett

Two colliding atoms can absorb a photon and be photoassociated into an excited, diatomic molecule, NIST researchers investigated the fundamental rate at which

Optical Diffraction in Close Proximity to Plane Apertures. I. Boundary-Value Solutions for Circular Apertures and Slits

August 1, 2002

Author(s)

Klaus Mielenz

In this paper the classical Rayleigh-Sommerfeld and Kirchhoff boundary-value diffraction integrals are solved in closed form for circular apertures and slits

Electron-Impact Cross Sections for Dipole- and Spin-Allowed Excitations of Hydrogen, Helium, and Lithium

August 1, 2002

Author(s)

Philip M. Stone, Yong Sik Kim, J P. Desclaux

Electron-impact excitation cross sections are calculated and presented for the dipole-and spin-allowed transitions from the ground states to the np 2P states

Quantitating Fluorescence Intensity From Fluorophores: Practical Use of MESF Values

July 1, 2002

Author(s)

Lili Wang, Adolfas K. Gaigalas, F Abassi, G E. Marti, R F. Vogt, A Schwarz

The present work uses fluorescein as the model fluorophore and points out critical steps in the use of MESF (Molecules of Equivalent Soluble Fluorophores)

A Critical Evaluation of Interlaboratory Data on Total, Elemental, and Isotopic Carbon in the Carbonaceous Particle Reference Material, NIST SRM 1649a

June 1, 2002

Author(s)

Lloyd A. Currie, Bruce A. Benner Jr, H A. Cachier, R Cary, J C. Chow, David L. Urban, T. I. Eglinton, O Gustafsson, P C. Hartmann, J I. Hedges, J D. Kessler, T Kirchstetter, D Klinedinst, George A. Klouda, J V. Marolf, C A. Masiello, T Novakov, A. Pearson, K M. Prentice, H Puxbaum, J G. Quinn, C. M. Reddy, H Schmid, J F. Slater, Stephen A. Wise, J Watson

A primary purpose of this report is to provide documentation for the new isotopic and chemical particulate carbon data for certified, reference and information

Understanding Part Fabrication Errors in Closed-Loop Machining Systems

June 1, 2002

Author(s)

Herbert T. Bandy, Lawrence A. Welsch

This paper presents an analysis of part fabrication errors (part dimension and form deviations) in closed-loop machining systems. Modeling methods are used to