Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Lattice Matching (LM)-Prevention of Inadvertent Duplicate Publications of Crystal Structures

Published

Author(s)

Alan D. Mighell

Abstract

Lattice-matching techniques have proved to be an extremely effective for the identification of unknown crystalline materials. A commonly employed lattice-matching strategy is based on matching the reduced cell of an unknown against a database of known materials represented by their respective standard reduced cells. The success of the method relies on the fact that the lattice or the lattice plus chemical information (e.g. element types) is highly characteristic of a material-like a finger print. Because of its intrinsic power, the procedure has many and diverse applications-in materials characterization, in nano-technology, in epitaxial growth, in materials design, etc. An especially fruitful role for the method is in the journal publication process as the quality of the scientific literature can be enhanced. The focus herein is on the major role that lattice matching can play in the experimental and publication process in the prevention of inadvertent duplicate publications and in the determination of key cross-references.
Citation
Journal of Research (NIST JRES) -
Volume
107 No. 5

Keywords

cystallography, identification, lattice matching, mathematical lattices, multiple publication of same structure, reduction

Citation

Mighell, A. (2002), Lattice Matching (LM)-Prevention of Inadvertent Duplicate Publications of Crystal Structures, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed November 9, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 1, 2002, Updated February 19, 2017