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Semiconductors are the cornerstone of modern electronics. They’re used in solar cells, light emitting diodes (LEDs), microprocessors in laptops and cell phones
As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer
It's hardly a character flaw, but organic transistors—the kind envisioned for a host of flexible electronics devices—behave less than ideally, or at least not
National Institute of Standards and Technology (NIST) researchers are seeing the light, but in an altogether different way. And how they are doing it just might
Researchers from the National Institute of Standards and Technology (NIST) and Intel reported success using an X-ray scattering technique to accurately measure
The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry
In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture
A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes seemed
Photovoltaic devices, also known as solar cells, produce electrical power when exposed to light, and that technology has enabled a fast-growing industry. The
Imaging and mapping of electric fields at radio frequencies (RF)* currently requires the use of metallic structures such as dipoles, probes and reference
When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of
JILA physicists used an ultrafast laser and help from German theorists to discover a new semiconductor quasiparticle—a handful of smaller particles that briefly
Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists
A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to
Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a
As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to
How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference
Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron
The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a collaboration of
A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers
The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on "Flexible Printed Electronics