Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Physical Measurement Laboratory

Nanoscale Device Characterization Division

News and Updates

Keyword

Topic Area

PML Scientists Discover a Better Metal Contact that Improves Two-Dimensional Transistor Performance

January 16, 2015

Two-dimensional (2D) materials* such as molybdenum-disulfide (MoS 2) are attracting much attention for future electronic and photonic applications ranging from

Set up for X-ray Photoelectron Spectroscopy with Graphene Windows

Graphene Offers X-Ray Photoelectron Spectroscopy a Window of Opportunity

December 22, 2014

X-ray photoelectron spectroscopy (XPS) is one of the most sensitive and informative surface analysis techniques available. However, XPS requires a high vacuum

iNEMI Board of Directors Visits NIST

December 10, 2014

NIST hosted the Board of Directors of the International Electronics Manufacturing Initiative (iNEMI) on Wednesday, Dec. 10, 2014, for a half-day overview on

PML Outreach Promotes STEM Excitement

December 10, 2014

Michael Postek of PML's Semiconductor & Dimensional Metrology Division has been an instrumental part of an outreach to bring access to tabletop scanning

Transmission electron microscopy image of a thin cross section of 160 nanometer trenches shows deposited nickel completely filling the features without voids.

NIST-Intel Partnership Workshop

December 3, 2014

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and Architecture

Researchers Take First Pictures of Baby Nanotubes

December 1, 2014

Single-walled carbon nanotubes are loaded with desirable properties. In particular, the ability to conduct electricity at high rates of speed makes them

Simultaneous Imaging of Ferromagnetic and Ferroelectric Domains

October 1, 2014

An international team led by researchers from the NIST Center for Nanoscale Science and Technology have discovered a new way to simultaneously image both the

Measuring Absorption Maps and Spectra of Plasmonic Resonators with Nanoscale Resolution

September 10, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the University of Maryland have for the first time used photothermal induced

NIST Helps Develop New Standard for Microsensor Technology

September 9, 2014

The National Institute of Standards and Technology (NIST) has contributed to the development of a new standard for defining the performance of micromechanical

Scientists Shed Light on Organic Photovoltaic Characteristics

September 2, 2014

Photovoltaic devices, also known as solar cells, produce electrical power when exposed to light, and that technology has enabled a fast-growing industry. The

Optical Microscope Technique Confirmed as Valid Nano-Measurement Tool

August 26, 2014

Recent experiments have confirmed* that a technique developed several years ago at the National Institute of Standards and Technology (NIST) can enable optical

Beyond Six Nines: Ultra-enriched Silicon Paves the Road to Quantum Computing

August 11, 2014

Using a relatively straightforward technique, a team of NIST researchers has created what may be the most highly enriched silicon currently being produced. The

Manipulating Magnetic Field Effects in Organic Semiconductors

July 10, 2014

Changing the polarity of the magnetic field response of a material one thousandth the width of a human hair may seem like the stuff of science fiction, but that

Nanoelectronics: First Measurement of Moly's Thermal Conductivity

May 21, 2014

Angela Hight Walker of PML's Semiconductor and Dimensional Metrology Division and colleagues have succeeded in measuring a previously unknown but essential

Schematic of the NIST focused lithium ion beam microscope

This FIB Doesn't Lie: New NIST Microscope Sees What Others Can't

May 6, 2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, when operated in their most typical high-energy modes

Nanotube-Infused Clothing May Protect Against Chemical Weapons

May 6, 2014

Nerve agents are among the world's most feared chemical weapons, but scientists at the National Institute of Standards and Technology (NIST) have demonstrated a

PML Leadership Prominent Throughout Newly Released ITRS

April 24, 2014

When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of

Schematic showing metal-organic framework materials on a surface. Their expansion, which is induced by an infrared laser, is detected using the tip of an atomic force microscope.

Looking Inside: Assessing the Chemical Composition of a Metal-Organic Framework with Nanoscale Resolution

March 11, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST), in collaboration with researchers from University of Lyon, France, have applied a

PML Contributes to Formation of Landmark IEEE Standards Committee and Working Group for MEMS Sensor Performance Parameters

March 5, 2014

MicroElectroMechanical Systems (MEMS) devices are everywhere, from automobiles (airbag sensors, tire-pressure monitoring systems, vehicle stabilization control)