Steve Blankenship, an Instrumentation Specialist in the NIST Center for Nanoscale Science and Technology (CNST), has been awarded the 2013 George T. Hanyo Award by the AVS "for outstanding contributions to the scanning tunneling microscopy user facilities and other laboratories at the Center for Nanoscale Science and Technology at the National Institute of Standards and Technology."
The award, established in 1996 by the Kurt J. Lesker Company in the memory of George T. Hanyo, a highly skilled, long-time employee of the company, recognizes outstanding performance in technical support of research or development in areas of interest to the AVS. The award is intended for a technical support staff member who is typically mentioned in the "Acknowledgements" sections of published papers but, with the possible exception of papers describing new apparatus or procedures, is rarely an author or co-author.
Steve was presented with the award on October 30, 2013 at the AVS 60th International Symposium and Exhibition in Long Beach, California.