Instrument Purpose
Measures structural features across length scales from 1 nm to 2,000 nm by employing a 45-meter flight path, converging beam optics, and multi-carriage detector arrays for comprehensive Q-range coverage.
Key Capabilities
- Broad Simultaneous Q-Range: Three independent detector arrays spanning a 45-meter flight path cover the complete scattering vector range (0.002 nm-1 ≤ Q ≤ 10 nm-1) in a single setting, making it optimal for kinetic and time-resolved measurements.
- Converging Beam Optics: Lenses and prisms correct for gravity smearing while enabling the use of larger samples, yielding up to a 200× gain in count rates compared to standard pinhole collimation.
- Variable Monochromation: Flexible beam definition via a mechanical velocity selector (Δλ/λ = 12%), a double-reflection HOPG monochromator (Δλ/λ = 1%), or a filtered broad-spectrum beam for low-resolution, high-flux requirements.
- Polarized Beam Capabilities: Full beam polarization analysis supported using an integrated 3He spin filter.
Research Domains
- Soft Matter & Complex Fluids: Hierarchical self-assembly in surfactants, block copolymers, microemulsions, and colloidal suspensions.
- Biological Structures: Macromolecular complexes, lipid membranes, proteins, and biomimetic assemblies over multi-nanometer dimensions.
- Polymers & Composites: Phase separation, domain morphology, cross-linking networks, and nanoparticle dispersion in nanocomposites.
- Advanced Materials: Porosity distribution, mesoporous structures, precipitate kinetics in alloys, and magnetic domain configurations.
What You Can Measure
- Hierarchical Size Distribution: Particle sizes, pore structures, and structural correlations spanning from 1 nm to 2,000 nm.
- Kinetic & Time-Resolved Scattering: Non-equilibrium structural evolution captured continuously without needing to move detector positions.
- Anisotropic & Oriented Structures: Two-dimensional scattering patterns under external shear, magnetic, or thermal fields.
- Polarized Neutron Scattering: Separation of nuclear and magnetic scattering density profiles in nanocomposites and magnetic fluids.
Technical Specifications
| Parameter | Specification |
|---|
| Source Type | Cold Neutron Guide (NG-3, 60 mm × 150 mm) |
| Q-Range | 0.002 nm-1 to 10 nm-1 (0.0002 Å-1 to 1.0 Å-1) |
| Accessible Size Regime | 1 nm to 2,000 nm |
| Wavelength Range (λ) | 4.0 Å to 12.0 Å |
| Wavelength Resolution (Δλ/λ) | 1% (HOPG Monochromator), 12% (Velocity Selector), ~40% (Filtered Mirror Beam) |
| Collimation Modes | Circular Pinholes, Narrow Slits, or Converging Multiple Beams (Focussing Lenses) |
| Source-to-Sample Distance | 4 m to 22 m (in 2 m steps) |
| Detector System | 3 separate carriages (Front/Middle: 3He tubes, 8 mm resolution; Rear: Scintillator + CCD, 0.2 mm resolution) |
| Sample Space | 2 m sample area accommodating sample sizes from 5 mm diameter up to 36 mm × 72 mm |
Specialized Sample Environments
- Rheology & Shear Cells: Capillary RheoSANS, MCR 301/501 stress-controlled rheometers, and 1-2 Shear Cells for structural studies under flow.
- Temperature & Thermal Control: Standard heating blocks, fluid circulating baths, and dedicated cryogenic sample stages.
- Magnetic Fields: Electromagnets and superconducting magnet systems for magnetic field-aligned scattering.
- Pressure Cells: Liquid Insertion Pressure System for SANS (LIPSS) and gas-loading pressure cells for in-situ measurements.
Expertise & Support
- CHRNS Facility Support: Jointly funded by NIST and the National Science Foundation (NSF) under Agreement No. DMR-2010792, providing full technical and scientific user support.
- Data Reduction & Modeling: Supported pipelines for automated 2D data reduction and state-of-the-art structural modeling using SasView.
Access & Resources
elizabeth.kelley [at] nist.gov (elizabeth[dot]kelley[at]nist[dot]gov)
(301) 975-8584
jonathan.gaudet [at] nist.gov (jonathan[dot]gaudet[at]nist[dot]gov)
(301) 975-5010
ryan.murphy [at] nist.gov (ryan[dot]murphy[at]nist[dot]gov)
(301) 975-8544
cedric.gagnon [at] nist.gov (cedric[dot]gagnon[at]nist[dot]gov)
(301) 975-2020