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Materials

Materials characterization

Projects/Programs

Keyword

Organizational Unit

Polymer Additive Manufacturing and Rheology

Ongoing

The manufacture of polymeric materials from their raw form into their final useful product occurs under highly non-equilibrium conditions where temperature and

Polymer Formulations

Completed

Our goal is to develop combinatorial and high-throughput measurement approaches for rapid characterization of the structure and phase behavior of multicomponent

Schematic of selective transport of water, ions, or molecules across a polymer membrane.

Polymer Membranes

Ongoing

Membranes and sorbents are key to the nation’s water and energy security. Polymer-based membranes already play a significant role in fields such as water

Picture of PBD set up for wavelength measurement

Powder Diffraction SRMs

Ongoing

The work carried out under this project creates a wide variety of X-ray powder diffraction (XRPD) Standard Reference Materials (SRMs) used to calibrate and

Precision X-ray Emission Line Measurements

Ongoing

The PBD is making new, state-of-the-art measurements of the wavelengths of select atomic X-ray emission lines. These measurements underpin all precision x-ray

Radioanalytical Metrology

Ongoing

Raman Metrology and Instrumentation

Ongoing

We develop measurement capabilities and protocols to validate and advance the science of Raman spectroscopy and work to establish NIST as a unique resource to

Reliability Metrologies for Advanced Electronic Interconnects

Completed

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such tests are

Secondary Ion Mass Spectrometry Ion Source Development

Ongoing

The use of cluster sources such as C 60 and argon gas cluster ion beams (Ar GCIB) allow for the analysis of the subsurface volume. It can also minimize the

Standard Solution SRMs Provide Traceability for Millions of Measurements

Ongoing

For decades, NIST has provided the SRM 3100 series single-element standard solutions. The certified values are traceable to the International System of Units

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing

The aim of this project is to develop robust, quantitative measurement methods utilizing transmission electron microscopy methods for complex, nanostructured

Surface Desorption Ambient Mass Spectrometry

Ongoing

Surface desorption ambient mass spectrometry enables direct solid surface interrogation for sampling and ionization of trace analytes. This project encompasses

Synchrotron Resonant Scattering and Diffraction

Ongoing

Through the NIST BNL partnership, the Resonant Scattering and Diffraction project seeks to develop and operate synchrotron measurements that provide spatial

Synchrotron X-ray Absorbance Spectroscopy

Ongoing

A core competency of the NIST BNL strategic partnership, the Absorbance Spectroscopy effort in the Synchrotron Science Group seeks to develop measurements that

Synchrotron X-ray Spectroscopic Imaging

Ongoing

The Spectroscopic Imaging project develops hyperspectral imaging capabilities the probe the chemical, electronic, and physical structure in advanced materials.

Synthesis and longevity of candidate direct air capture (DAC) materials

Ongoing

Our team is focusing on developing reliable methods to characterize DAC materials for longevity and stability. We are currently focusing on aminosilane-silica

Thermal Desorption Ambient Mass Spectrometry

Ongoing

Thermal desorption ambient mass spectrometry decouples analyte desorption and ionization. Here, analytes are thermally desorbed directly from a primary surface

Time-of-Flight Secondary Ion Mass Spectrometry

Ongoing

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular

Tissue Engineering

Ongoing

Our goal is to develop reliable tools and standards for measuring the properties of cells, biomaterials, scaffolds and tissue-engineered constructs. As

SRM 3452 certified Seebeck coefficient data

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing

Develop critical thermal and electrical transport measurement methods, instrumentation, and reference materials needed to support the development, performance

X-Ray Computed Microtomography

Ongoing

Seeing inside a material object, in three dimensions, is often crucial for proper characterization, so that the link between microstructure and properties can

X-ray Testbed for Breakthrough Catalyst Measurements

Ongoing

NIST’s Material Measurement Laboratory and Physical Measurement Laboratory are developing a first-of-kind X-ray testbed for operando monitoring of catalytic

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