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Projects/Programs

Displaying 51 - 75 of 120

Knowledge Extraction and Application

Completed
The Knowledge Extraction and Application (KEA) project will contribute to standards and test methods that normalize models, methods, and technologies for

Marciniak Multiaxial Testing

Ongoing
A novel method for measuring multiaxial stress-strain curves in sheet metal has been designed based on a modified Marciniak punch stretching geometry. Since the

METIS

Ongoing
A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024

Metrology for Nanoimprint Lithography

Completed
Our goal is to develop, advance, and demonstrate measurements that facilitate Nanoimprint Lithography (NIL) as a viable technology for the patterning of robust

Metrology for Nanomaterials in Medicine

Ongoing
Advances in methods, instrumentation and standards promote the development of measurement science capabilities in separation technology and physical-chemical

Mobility Performance of Robotic Systems

Ongoing
Mobile Robotic Systems, which include mobile bases (wheeled or legged) and onboard systems (manipulators, sensors, and end effectors such as tools, grippers

Model-Based Enterprise Program

Ongoing
The Model-Based Enterprise (MBE) program aims to answer how a manufacturer can match product needs to process capabilities to determine the best assets and ways

Model-Based Manufacturing Services

Ongoing
To develop and deploy to industry advances in standards and measurement science for model-based messaging standards and service-modeling methodology to enable