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Projects/Programs

Displaying 101 - 103 of 103

Transport Property Measurements for Semiconductors and Energy Materials

Ongoing
The image above is an exploded cross section diagram representing the simplified structure layers in a MOSFET transistor. Thermoreflectance (TR) laser-based measurement techniques, a key focus of this project, can measure the thermal properties of substrates, thin films, multilayer structures, and...

Ultrafast Spectroscopy to Advance Microelectronics

Ongoing
Continued advancement in microelectronics, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications as defined by the OSTP “National Strategy on Microelectronics Research,” requires knowledge of material...

Universal Microscopy Standards

Ongoing
Microscopy standards that are available today have inadequate performance characteristics. As device linewidths decrease toward physical limits, the international roadmap of devices and systems (IRDS) has set uncertainty targets by the year 2025. This target is hard to hit, challenging the industry...
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