Advancing Micro- and Nanoplastic (MNP) Metrology

Repeatability and reproducibility of micro- and nanoplastic measurement have been hindered by a lack of available and well-characterized reference materials. NIST researchers are developing optimal methods along the entire workflow, including extraction, purification, and analysis of count, size, shape, polymer identity, and mass of MNPs.  

Research Activities

Nanoplastic Arrays for Microspectroscopy Calibrations

This activity is developing nanoplastic arrays as innovative reference materials for microspectroscopy calibrations, building on existing efforts related to universal microscopy standards. Nanoplastic arrays provide systematic control of particle size and shape, enabling optical–dimensional correlation by fluorescence and infrared spectroscopy of low-density polyethylene nanostructures on silicon. Additionally, NIST is innovating measurement error models to reduce bias in correlative models of nanoplastic analytes. Read more. Contact: Samuel Stavis.

Micro- and Nanoplastic Metrology

The goal of this project includes 1) developing and disseminating MNP separations and characterization methods using model systems, 2) investigating and developing methods for generating test materials, and 3) evaluating MNP chemical signatures in controllably aged test materials. Read more. Contact: Justin Gorham and John Pettibone.

A past effort focused on developing sampling methodologies for collection of airborne plastic particles and applied/developed protocols for identifying particles using spectroscopic and microscopic approaches. Read more. Contacts: Abigail Lindstrom and Diana Ortiz-Montalvo.

Micro- and nanoplastics is a primary focus area for the Materials Measurement Science Division. Read more.

Aerosol Metrology for MNP Detection

This work aims to advance the detection, characterization, and sizing of nanoparticles in liquid media using aerosol-based methods. These methods have utility wherever the number concentration and size distribution of sub-μm particles need to be rapidly measured in a solvent/matrix-free environment. In the realm of nanoplastics, the aerosol metrology provides the added benefit of requiring minimal sample preparation and was demonstrated in this publication. Contacts: Christopher Zangmeister and James Radney.

Advancing Measurement Techniques for MNP Analysis

There are several efforts at NIST to develop and evaluate new techniques for determining MNP size and composition.  These include:

• Optical photothermal infrared (OPTIR) microscopy: OPTIR microscopy methods are being developed to chemically identify, characterize, and monitor changes to particle properties with sub-micrometer lateral resolution. The application of OPTIR to monitor changing micro- and nanoplastic particle signatures after simulated weathering processes has been demonstrated in this publication. Contact: John Pettibone.
• Solvent absorption compensated advanced infrared (IR) imaging: NIST is exploring if advances in high-sensitivity IR spectroscopy based on the solvent adsorption compensation techniques can be used for microplastic metrology. Read more. Contact: Young Jong Lee

Recaptured and Reclaimed Plastic Measurements

NIST has worked to develop innovative methods and technologies for analyzing quantities, types, and sources related to used plastics, including developing a device to separate microplastics from sediment. Read more. Additionally, methods to detect and quantify plastic additives in a variety of environmental sample matrices with two instruments: gas chromatography-mass spectrometry (GC/MS) and pyrolysis-GC/MS were advanced. Read more. Contact: Jessica Reiner.

Explore the rest of the Circular Economy program’s Polymer / Plastics activities.