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Samuel M. Stavis (Fed)
Samuel M. Stavis is the Leader of the Nanostructure Fabrication and Measurement Group. He received a B.S.E. in Engineering Physics from the University of Michigan and a M.S. and Ph.D. in Applied Physics from Cornell University, where he was also a Postdoctoral Research Associate in Biological and Environmental Engineering. At Cornell, he performed early research in measuring fluorescence from single molecules in nanofluidic devices. Sam joined the NIST staff through a National Research Council Postdoctoral Research Associateship award. At NIST, he has advanced what is possible to make and measure at small scales. By developing and combining fabrication processes, device technologies, and microscopy methods, he has established new ways and limits of controlling and quantitating nanoscale systems. His research has diverse applications in manufacturing, healthcare, and the environment. Sam has received a Bronze Medal award, two Innovations in Measurement Science awards, a Strategic and Emerging Research Initiative award in support of the Circular Economy Program, and an Outstanding Authorship award from NIST.
Selected Publications
- Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles", A. C. Madison, A. L. Pintar, C. R. Copeland, N. Farkas, and S. M. Stavis, ACS Nano 17, 10, 8837–8842 (2023).
NIST Publication Database Journal Web Site (link is external) - Unmasking the Resolution–Throughput Tradespace of Focused-Ion-Beam Machining, A. C. Madison, J. S. Villarrubia, K.-T. Liao, C. R. Copeland, J. Schumacher, K. Siebein, B. R. Ilic, J. A. Liddle, and S. M. Stavis, Advanced Functional Materials 32, 38, 2111840 (2022).
NIST Publication Database Journal Web Site (link is external) - Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy, L. C. C. Elliott, A. L. Pintar, C. R. Copeland, T. B. Renegar, R. G. Dixson, B. R. Ilic, R. M. Verkouteren, and S. M. Stavis, Analytical Chemistry 94, 2, 678-686 (2021).
NIST Publication Database Journal Web Site (link is external) - Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).
NIST Publication Database Journal Web Site (link is external) - Bubble Magnetometry of Nanoparticle Heterogeneity and Interaction, A. L. Balk, I. Gilbert, R. Ivkov, J. Unguris, and S. M. Stavis, Physical Review Applied 11, 061003 (2019).
NIST Publication Database Journal Web Site (link is external) - Equilibrium free energies from non-equilibrium trajectories with relaxation fluctuation spectroscopy, D. Ross, E. A. Strychalski, C. Jarzynski, and S. M. Stavis, Nature Physics 14, 842-847 (2018).
NIST Publication Database Journal Web Site (link is external) - Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).
NIST Publication Database Journal Web Site (link is external) - Subnanometer structure and function from ion beams through complex fluidics to fluorescent particles, K.-T. Liao, J. Schumacher, H. J. Lezec, and S. M. Stavis, Lab on a Chip 18, 139-152 (2018).
NIST Publication Database Journal Web Site (link is external) - Nanoparticle Manufacturing – Heterogeneity through Processes to Products, S. M. Stavis, J. A. Fagan, M. Stopa, and J. A. Liddle, ACS Applied Nano Materials 1, 4358-4385 (2018).
NIST Publication Database Journal Web Site (link is external)
