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Search Patents by Samuel M. Stavis

Displaying 1 - 5 of 5

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an
Diagram of cells and other components within a blood vessel

Measuring a size distribution of nucleic acid molecules in a sample

NIST Inventors
Craig Copeland and Samuel M. Stavis
Patent Description This invention is a method for measuring the size of single nucleic-acid molecules. Measuring the size of nucleic-acid molecules is important in a variety of applications ranging from criminal forensics to clinical diagnostics. The invention advances conventional methods and
an image showing several different charts and figures that is titled "High-Resolution imaging and spectroscopy at High Pressure: A Novel Liquid Cell for the TEM"

Vacuum Compatible Fluid Sampler

NIST Inventors
Glenn Holland , Samuel M. Stavis and James Alexander Liddle
Patent Description The transmission electron microscope (TEM), with its ability to deliver atomic-scale spatial, and < 100 meV spectroscopic resolution, has enabled countless breakthroughs in materials science. From the early days of TEM development, researchers have sought to use the power of this
Drawings describing the technology within patent 10,639,634

Vacuum Compatible Fluid Sampler

NIST Inventors
James Alexander Liddle , Samuel M. Stavis and Glenn Holland
Patent Description This invention is a complete system comprising a novel chip and chip holder that enables routine, high-resolution imaging and spectroscopy of samples in liquids and high-pressure gases in the transmission electron microscope (TEM). The system overcomes limitations in liquid-layer