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Gaithersburg

NIST Associates for OWM

Click on the photos below to view the biography webpage. NIST Associates Previous NIST Associates and Student Interns

OWM Welcomes Pathways Intern, Cyra Golwalla

Cyra is a student at Mount St. Mary’s University, graduating with her Bachelor of Science degree in Business Management. She is very aware...

OWM Welcomes Montgomery College Interns

Byline: Elizabeth Benham Help the Office of Weights and Measures (OWM) welcome Dinelka Jagoda and Tanna Nguyen, two spring Professional...

Virtual Reality

Speakers Simon Su Title of Talk: VIRTUAL AND AUGMENTED REALITY APPLICATIONS TO SUPPORT DATA ANALYSIS AND ASSESSMENT OF SCIENCE AND...

Quantum Science

Speakers Victor V. Albert Title of Talk: NIST QUANTUM EFFORTS AT UMD COLLEGE PARK Topic Areas: quantum science Read More Thomas Gerrits...

Intersection of Technology and Policy

Speakers Cherilyn Pascoe Title of Talk: EMERGING TECHNOLOGY POLICY: UNDERSTANDING THE IMPACT OF RESEARCH AND TECHNOLOGY Topic Areas...

Information Retrieval

Speakers George Awad Title of Talk: TRECVID - EVALUATING COMPUTER VISION TASKS USING REAL-WORLD DATASETS Topic Areas: Computer Vision, Video...

Human Factors, Usability

Speakers Shanée Dawkins Title of Talk: THE NIST USABILITY GROUP: CHAMPIONING THE HUMAN IN IT Topic Areas: Usability, human centered design...

Digital Forensics

Speakers Haiying Guan Title of Talk: OPEN MEDIA FORENSIC CHALLENGE (OpenMFC) EVALUATION PROGRAM Topic Areas: Open Media Forensic Challenge...

Cybersecurity and Privacy

Speakers Julie Haney Title of Talk: HUMAN-CENTERED CYBERSECURITY Topic Areas: cybersecurity, privacy, usability, smart homes, internet of...

Computational Science, Applied Mathematics

Speakers Jeffrey Fong Title of Talk: WHY ENGINEERS NEED TO KNOW HOW TO SOLVE EQUATIONS "EXACTLY" USING A COMPUTER Topic Areas: Algebraic...

Artificial Intelligence/Machine Learning

Speakers Peter Bajcsy Title of Talk: MEASUREMENTS OF CLASS ENCODINGS IN NEURAL NETWORKS Topic Areas: neural networks, artificial...

Engagement with Universities and Colleges

Innovation is paramount at ITL and can only be achieved through the diversification of ideas. This outreach is intended to expand our...

NanoFab Tool: Reactive Ion Etcher 790 Nitride Left

This PlasmaTherm 790 reactive ion etcher (RIE) is a parallel plate plasma etching system which uses fluorocarbon and oxygen gases to etch silicon nitride thin

Icon of clipboard with check marks and an x

OWM Launches New Metrology Training Needs Survey

March 25, 2022

The Office of Weights and Measures (OWM) is a relatively small office at NIST, but has a big footprint in the weights and measures community. With just over 20

The Future is Charged: U.S. Electric Vehicle Infrastructure

March 29, 2022 - September 30, 2022

Please see the Electric Vehicle Supply Equipment Program on the NIST OWM website for any current updates on NIST standards, measurement services, and training

Graphic Image of Weights and Measurements Featured Collection

Discover NIST Education Resources!

March 27, 2022

The National Institute of Standards and Technology (NIST) invites learners of all ages to explore and discover a wide variety of Science, Technology

ACMD Seminar: Discrete Optimization Techniques for Network and Data Analysis

Illya Hicks Computational and Applied Mathematics Department, Rice University Tuesday, April 26, 3:00-4:00 EDT (1:00-2:00 MDT) A video of...

Radio Access and Propagation Metrology Group

Wireless Systems Innovation and Performance Group

Collaborates with government, industry, and academia to design, evaluate, and standardize future wireless networks that are robust, interoperable, intelligent, and high-performing.

Ultraviolet Light Can Clean N95 Masks for Reuse Without Hindering Performance, NIST Study Shows

March 25, 2022

To combat COVID-19 amid supply shortages in 2020, health care facilities across the U.S. resorted to disinfecting personal protective equipment (PPE), such as

Photo of a student working in the laboratory

We're Back... OWM Welcomes Laboratory Metrology Students to Campus!

March 28, 2022

NIST Office of Weights and Measures (OWM) resumed limited in-person laboratory metrology training at the Gaithersburg campus starting on January 31, 2022. We

NIST-MSU STEM Symposium

Thu, Mar 24 2022, 9:00am - 2:30pm EDT

The Science, Technology, Engineering and Mathematics (STEM) Symposium is a virtual forum to strengthen ties between NIST

OWM Welcomes New Associate, María Peñahora Cañeque Simón

María received her master’s degree in electrical engineering from Pontificia Comillas University ICAI, in Madrid, Spain in 2012. After three...

World Metrology Day Poster Graphic Image

Celebrate World Metrology Day on May 20

March 26, 2022

“World Metrology Day is an annual celebration of the signature of the Meter Convention on 20 May 1875 by representatives of seventeen nations. The Convention

ITL Speakers Bureau: James Lyle

Title of Talk: OVERVIEW OF DIGITAL FORENSICS ABSTRACT: Following A Tasty Case Natasha Romanov (former secret agent) has retired and opened a...

Setting the Standards: Strengthening U.S. Leadership in Technical Standards

March 17, 2022

Referenced Speaker

James K. Olthoff

Introduction Chairwoman Stevens, Ranking Member Feenstra, and members of the Subcommittee, I am Dr. James Olthoff, Performing the Non-Exclusive Functions and...

Not Letting It Slip By: NIST Discovery Could Increase Accuracy in Measuring Blood Flow for Cancer Diagnosis, Other Applications

March 22, 2022

Researchers at the National Institute of Standards and Technology (NIST) have discovered a potential source of error when using acoustic waves to measure the

George Awad

Title of Talk: TRECVID - EVALUATING COMPUTER VISION TASKS USING REAL-WORLD DATASETS ABSTRACT: Image and video data continues to gain...

An illustration for AI shows a silhouette of a human head containing icons for computer networks.

NIST Seeks Comments on Draft AI Risk Management Framework, Offers Guidance on AI Bias

March 17, 2022

Seeking to promote the development and use of artificial intelligence (AI) technologies and systems that are trustworthy and responsible, NIST today released

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