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FY2019 Patents

The National Institute of Standards and Technology (NIST) places emphasis on Lab-to-market (L2M) or transfer of NIST intellectual property - original technologies, inventions, and methods (IP) to business and industry. Below is a list of FY 19 patents. A complete list of NIST patents is available for review at the Federal Laboratory Consortium (FLC): https://www.federallabs.org/labs/national-institute-of-standards-and-technology-nist-0.

Please contact our Senior Patent Officer, Dr. Donald Archer, to inquire about licensing NIST patents.

ICEMAKER, PROCESS FOR CONTROLLING SAME AND MAKING ICE

Patent Number: 10174981

Description: The primary function of a domestic refrigerating appliance is to maintain a low temperature within a cabinet.  The desired set temperature is generally maintained by cycling the appliance's refrigeration system (compressor, fans, etc.) on and off.  Automatic icemakers are commonly installed in low temperature compartments or sub-compartments of domestic refrigerating appliances in the United States.  They are directly connected to a source of water from which they produce ice and store it in a low temperature bin.  Their operation consists of cycling a series of steps and they operate independently from the refrigerating appliance's cycle.  Our invention provides a process for synchronizing these cycles in a way that maximizes the efficiency of these systems when they operate simultaneously.

FLC Link: https://www.federallabs.org/technology/icemaker-process-for-controlling-same-and-making-ice

Inventor: David Yashar

Expiration Date: 7/31/2036

 

ANTI-COUNTERFEITING ARTICLE, PROCESS FOR MAKING AND USING SAME

Patent Number: 10152666

Description: This invention provides for a new and useful metrology to enable counterfeit detection system capable of uniquely marking items by encoding information in their physical structure at the nanoscale. The system depends on rapidly encoding information in the physical structure of an object and to rapidly read such information with arrays of near-field coupled probes. Core to this invention are the techniques to create nanoscale quick-read codes through deterministic placement of electromagnetically active dopant clusters, and methods to measure the size and electrical activity of each cluster. The Initial demonstrations are on silicon wafers, but such techniques will be applicable to all manufactured products including pharmaceuticals.

FLC Link: https://www.federallabs.org/technology/anti-counterfeiting-article-process-for-making-and-using-same

Inventor: Yaw S. Obeng, Joseph J. Kopanski, and Jung-Joon Ahn

Expiration Date: 1/17/2036

 

NONCONTACT RESONAMETER, PROCESS FOR MAKING AND USE OF SAME

Patent Number: 10261032

Description: A noncontact resonameter includes: a resonator to: produce an excitation signal including a field; subject a sample to the excitation signal; produce a first resonator signal in a presence of the sample and the excitation signal, the first resonator signal including: a first quality factor of the resonator; a first resonance frequency of the resonator; or a combination thereof, the first resonator signal occurring in an absence of contact between the sample and the resonator; and produce a second resonator signal in a presence of the excitation signal and an absence of the sample, the second resonator signal including: a second quality factor of the resonator; a second resonance frequency of the resonator; or a combination thereof; a circuit in electrical communication with the resonator to receive the first resonator signal and the second resonator signal; and a continuous feeder to: provide the sample proximate to the resonator; dispose the sample intermediately in the field of the excitation signal during production of the first resonator signal; remove the sample from the resonator; and manipulate a position of the sample relative to the resonator in a continuous motion and in an absence of contact between the sample and the resonator.

FLC Link: https://www.federallabs.org/technology/noncontact-resonameter-process-for-making-and-use-of-same

Inventor: Jan Obrzut, Nathan D. Orloff, Christian J. Long

Expiration Date: 1/19/2037

 

BROADBAND MICROWAVE PHASE SHIFT DETECTOR

Patent Number: 10247814

Description:

The new NIST detector senses very small phase shifts in a highly balanced microwave bridge.  An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a change in effective dielectric constant of the sample.  The major innovation associated with the detector centers on the ability to balance the bridge to an extremely fine degree.  The detector can be used to greatly increase the sensitivity of Fourier transform infrared spectroscopy (FTIR).  The detector can be used to greatly increase the sensitivity and temporal resolution of thermometry measurements.  In all cases, the probe dimensions define the spatial resolution and can be essentially arbitrary in geometry.  For example, the probe can be made longer to increase the overall sensitivity.  If spatial resolution is desired, the probe can be made smaller.  Since the measurement is non-contact, the high sensitivity lends itself quite nicely to scanned probe measurements.  The probe can be fabricated using standard silicon processing technology to produce low cost disposable probes and can greatly improve the repeatability of the measurement and reduce cross contamination.

In general, the strength of this detector invention is its ability to detect extremely minute changes in microwave phase shift.  Since this phase shift is directly proportional to sample temperature change, the detector can be used to greatly improve the sensitivity and utility of a wide variety of conventional measurement techniques.

FLC Link: https://www.federallabs.org/technology/broadband-microwave-phase-shift-detector

Inventor: Kin P. Cheung, Jason T Ryan and Jason Campbell

Expiration Date: 8/26/2037

 

A METHOD AND PROCESS FOR IMPOSING FINE-GRAINED NEXT GENERATION ACCESS CONTROLS OVER RDBMS SQL QUERIES AND DATABASE OBJECTS

Patent Number: 10127393

Description: The Policy Machine is an access control framework that served as the basis for the development of an American National Standards Institute (ANSI)/ the International Committee for Information Technology Standards (INCITS – the central U.S. forum dedicated to creating technology standards for the next generation of innovation) standards call the Next Generation Access Control (NGAC). 

NGAC consists of:

  • A standard set of data elements and relations that can be configured to express arbitrary access control policies in support of a wide variety of data services and applications;
  • A generic set of operations that include read, write, operations that can be performed on resource data, and administrative operations for configuring (creating and deleting) the data elements and relations that represent policies; and
  • A standard set of functions for computing access control decisions and enforcing policy over user access requests to perform read/write and its administrative operations

NGAC is a flexible access control framework in that it can be molded in support of combinations of diverse access control policies.  NGAC can often provide much of the same data service functionality that is provided by existing application products and system utilities, such as file management, workflow, and internal messaging and with similar performance.

FLC Link: https://www.federallabs.org/technology/a-method-and-process-for-imposing-fine-grained-next-generation-access-controls-over-rdbms

Inventor: Joshua Roberts, Gopi Katwala, David Ferraiolo, Serban Gavrila

Expiration Date: 4/28/2037

 

MASSIVELY PARALLEL WAFER LEVEL RELIABILITY SYSTEM

Patent Number: 10241149

Description: The massively parallel reliability (MPR) system is a measurement platform where thousands of semiconductor devices are tested for long term reliability.  The system is designed to perform some of the standard reliability tests for certain degradation mechanisms in semiconductor devices.  Conventionally, these tests require specific equipment dedicated for certain measurement conditions, which makes the reliability testing costly, space and time consuming, and often lacking the statistical accuracy needed for rigorous reliability predictions.  The MPR system provides a new compact solution for several aspects of semiconductor device reliability testing.  The system itself (Figure 1 below) is a rotating circular tray (lazy Suzan) that contains thirty testing stations, each with independent control.  The center of the system is a fixed platform where the center command computer is placed.  Attached to the fixed platform is a microscope that focuses on the loading position.  Thus, the operation is such that the silicon wafers are mounted onto the test station under the microscope in the loading position.  The silicon wafer is then put on electrical contact with the probe card placed on the top of its testing station.  The probe card is attached to electronic cards that control the experiment conditions and send the collected data to the central computer.  Once the given station is running, the user rotates the outer ring of the platform to put the next station under the loading position where a second set of conditions can be run.

FLC Link: https://www.federallabs.org/technology/massively-parallel-wafer-level-reliability-system

Inventor: Kin Cheung

Expiration Date: 1/16/2037

 

HUB AND SPOKE SYSTEM FOR DETECTING AND LOCATING GAS LEAKS

Patent Number: 10228490

Description: The current practice for detecting methanleaks is still in its infancy. There are several environmental regulations that have driven the development of Forward-looking Infrared (FLIR) cameras, thermographic cameras that senses infrared radiation, for detection of Volatile Organic Chemicals (VOCs), a category that includes methane. These FLIR cameras are the principle means for detecting leaks but suffer from several problems. FLIR cameras are expensive, require a human operatorand don'provide quantitative data on leak rate. This last point is critical since it means that no one knows how much methane is escaping. Managers aren't clear on how much company resources to dedicate to leak reduction since they don 't know how much revenuthey are losing.

Dual frequency comb spectrometers (DCS) are a new and unique measurement tool recently demonstrated over kilometer-scale outdoor paths for sensitive, accurate measurements of multiple trace gases, including methane. By measuring the unique absorption signature of many gas species simultaneously and with no distortion, these devices can determine the individual gas concentrations with high precision, stability, and without calibration between instruments or over time. DCS enables leak detection in gas fields by monitoring multiple beam paths across the field from a single centralized instrument. Leaks create small differences in the measured methane enhancement between the different beam paths, which are detected and coupled with high ­resolution meteorological simulations to locate and quantify the leak.

FLC Link: https://www.federallabs.org/technology/hub-and-spoke-system-for-detecting-and-locating-gas-leaks

Inventor: Gregory Rieker, Ian Coddingtion, Nathan R. Newbury, Kuldeep R. Prasad, Anna Karion

Expiration Date: 5/20/2036

 

EXTREME-UV ATOM PROBE TOMOGRAPHY INSTRUMENTATION

Patent Number: 10153144

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/%C2%A0imaging-spectrometer

Inventor: Norman A. Sanford, Ann Chiaramonti Debay

Expiration Date: 8/2/2036

 

BROADLY TUNABLE, HIGH-POWER, NARROW LINE-WIDTH, TABLE TOP, SOLID STATE, AUTOMATED, QUASI-CONTINUOUS WAVE, PARAMETRIC OSCILLATOR LIGHT SOURCE

Patent Number: 10156771

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/broadly-tunable-high-power-narrow-line-width-table-top-solid-state-automated-quasi

Inventor: Keith R. Lykke, Steven W. Brown, John T. Woodward

Expiration Date: 11/22/2036

 

METHOD OF THERMAL EXPANSION COMPENSATION BY PAIRED DISPLACEMENT MEASUREMENT

Patent Number: 10247536

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/method-of-thermal-expansion-compensation-by-paired-displacement-measurement

Inventor: Matthew S. Hoehler and Christopher Smith

Expiration Date: 11/16/2037

 

METHOD OF THERMAL EXPANSION COMPENSATION BY RESISTANCE MEASUREMENT

Patent Number: 10175150

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/method-of-thermal-expansion-compensation-by-resistance-measurement

Inventor: Matthew S. Hoehler and Christopher Smith

Expiration Date: 6/1/2037

 

PLASMONIC NANOMECHANICAL SUBDIFFRACTION MOTION SENSOR

Patent Number: 10247860

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/plasmonic-nanomechanical-subdiffraction-motion-sensor

Inventor: Brian J. Roxworthy, Alexander J. Liddle, Vladimir Aksyuk

Expiration Date: 10/9/2037

 

OPTOFLUIDIC PRESSURE SENSOR

Patent Number: 10151681

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/optical-flow-meter

Inventor: Zeeshan Ahmed, Gregory A Cooksey

Expiration Date: 8/9/2037

 

FLUID PLATFORM FOR TRANSMISSION ELECTRON MICROSCOPY

Patent Number: 102,656,99

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/a-nanofabricated-measurement-platform-for-quantitative-transmission-electron-microscopy

Inventor: Glenn Emerson Holland, Martin Samuel Stavis, Alexander J. Liddle

Expiration Date: 7/22/2037

 

METHOD FOR MEASURING THE SIZE OF SINGLE NUCLEIC-ACID MOLECULES

Patent Number: 10,379,038

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/method-for-measuring-the-size-of-single-nucleic-acid-molecules

Inventor: Robert Craig Copeland, Martin Samuel Stavis

Expiration Date: 9/26/2037

 

NUCLEOBASE-FUNCTIONALIZED ATOMICALLY THIN MEMBRANES FOR ACCURATE HIGH-SPEED DNA SEQUENCING

Patent Number: 10381107

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/nucleobase-functionalized-atomically-thin-membranes-for-accurate-high-speed-dna

Inventor:  Alexander Smolyanitsky

Expiration Date: 10/26/2037

 

A SYSTEM TO DETECT AND PROCESS X-RAY PULSES IN REAL TIME FROM MULTIPLE MICROCALORIMETER ABSORBERS INCORPORATING TRANSITION EDGE SENSORS

Patent Number: 10345249

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/a-system-to-detect-and-process-x-ray-pulses-in-real-time-from-multiple-microcalorimeter

Inventor: Stephen M. Thurgate, Terrance Jach

Expiration Date: 12/15/2037

 

THE THERMAL IMPEDANCE DRIVER

Patent Number: 10161961

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/microfabricated-optical-probe-for-integrated-photonic-devices

Inventor: Vladimir Aksyuk, Kartik Srinivasan and Thomas Michels

Expiration Date: 11/9/2037

 

PHOTONIC PROBE FOR AFM

Patent Number: 10261106

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/photonic-probe-for-afm

Inventor: Marcelo Davanco, Vladimir Aksyuk

Expiration Date: 10/31/2037

 

OPTOMECHANICAL MASS AND FORCE REFERENCE

Patent Number: 10352837

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/optomechanical-mass-and-force-reference

Inventor: Felipe Guzman, Ryan B. Wagner, Jacob M. Taylor, and Gordon A. Shaw

Expiration Date: 12/21/2037

 

A STROBOSCOPIC TRANSMISSION ELECTRON MICROSCOPE (TEM) FOR IMAGING AT MHz AND GHz RATES

Patent Number: 10319556

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/ultra-broad-band-continuously-tunable-electon-beam-pulser

Inventor: Jiaqi Qiu, Sergey Baryshev, June W Lau, Yimei Zhu

Expiration Date: 11/29/2037

 

QUANTUM COHERENT FREQUENCY SHIFT KEYING RECEIVER

Patent Number: 10382141

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/communication-linker-for-communication-linking

Inventor: Sergey Vladimirovich Polyakov, Ivan Burenkov

Expiration Date: 7/12/2038

 

SELF ALIGNED COPLANAR WAVEGUIDES

Patent Number: 10312568

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/self-aligned-coplanar-waveguides

Inventor: David Pappas

Expiration Date: 12/14/2037

 

HIGH EFFICIENCY PHOTON DETECTION

Patent Number: 10126255

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/high-efficiency-photon-detection

Inventor: Rachel Cannara, Fred Sharifi, Alex Smolyanitsky

Expiration Date: 1/27/2037

 

THE THERMAL IMPEDANCE DRIVER

Patent Number: 10236433

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/thermal-impedance-amplifier

Inventor: Adam McCaughan, Varun Verma, Sonia Buckley, Sae Woo Nam

Expiration Date: 1/23/2038

 

ENHANCING ABSORPTION MEASUREMENT SENSITIVITY BY PRE-COMPENSATING THE INCIDENT LIGHT FOR A LEVELED TRANSMISSION SPECTRUM

Patent Number: 10345226

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/spectrum-adjuster-and-producing-a-pure-analyte-spectrum

Inventor: Young Jong Lee

Expiration Date: 10/19/2038

 

DEVICE AND METHOD FOR PROTECTING AN AVALANCHE PHOTODIODE FROM EXCESSIVE RATE COUNTS

Patent Number: 10408672

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/device-and-method-for-proctecting-an-avalanche-photodiode-from-excessive-rate-counts

Inventor: David M. Rutter, Alan H. Band

Expiration Date: 4/27/2038

 

A STROBOSCOPIC TRANSMISSION ELECTRON MICROSCOPE (TEM) FOR IMAGING AT MHz AND GHz RATES

Patent Number: 10319556

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/ultra-broad-band-continuously-tunable-electron-beam-pulser

Inventor: Jiaqi Qiu, Sergey V Baryshev, June W Lau, Yimei Zhu

Expiration Date: 11/29/2037

 

DIGITAL PHANTOM MIMICKING TIME-OF-FLIGHT DISTRIBUTIONS IN BIOLOGICAL TISSUES

Patent Number: 10408741

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/optical-phantom-for-producing-a-time-resolved-diffuse-reflectance-spectrum

Inventor: Jeeseong Hwang, Heidrun Wabnitz

Expiration Date: 5/31/2038

 

OPTICAL TWO-WAY TIME-FREQUENCY TRANSFER

Patent Number: 10389514

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/optical-two-way-time-frequency-transfer

Inventor: Laura Sinclair, Nathan R. Newbury, William C. Swann, Hugo Bergeron, Jean-Daniel Deschenes

Expiration Date: 1/10/2038

 

SYSTEM OF A MECHANICAL RESONATOR

Patent Number: 10444431

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/reticulated-resonator-process-for-making-and-use-of-same

Inventor: Raymond Simmonds, Katarina Cicak, Cindy Regal, Pen-Li Yu, Yeghishe Tsaturyan, Thomas Purdy, Nir Kampel

Expiration Date: 5/22/2037

 

HIGHLY SELECTIVE GAN-NANORWIRE/TIO2-NANOCLUSTER HYBRID SENSORS FOR DETECTION OF BENZENE AND RELATED ENVIROMENT POLLUTANTS

Patent Number: 10168309

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/method-for-manufacturing-an-array-of-sensors-on-a-single-chip

Inventor: Abhishek Motayed, Geetha S. Aluri, Albert Davydov, Rao V. Mulpuri , Vladimir P. Oleshko, Ritu Bajpai, Mona E. Zaghloul

Expiration Date: 10/19/2036

 

METHOD AND APPARATUS FOR DYNAMIC SPECTRUM ACCESS USING SURVIVAL ANALYSIS

Patent Number: 10390364

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/method-and-apparatus-for-dynamic-spectrum-access-using-survival-analysis

Inventor: Timonthy A Hall, Anirudha Sahoo, Charles Hagwood, Sarah Streett

Expiration Date: 11/17/2037

 

FAST ENTANGLED STATE GENERATION AND QUANTUM INFORMATION TRANSFER IN QUANTUM SYSTEMS WITH LONG-RANGE INTERACTIONS

Patent Number: 10432320

Description: NIST has developed a method to use quantum systems with long-range interactions to do the following two things faster (in some cases exponentially faster) than in systems with short-range interactions: (1) accomplish quantum state transfer across the system; (2) prepare a large variety of entangled states (including multi-particle GHZ states) with applications to metrology and quantum computing. The protocol makes use of individual control of all participating quantum bits and takes advantage of long-range interactions in such a way that many interaction pathways coherently and constructively interfere to provide the speed-up. To accomplish state transfer, the initial state is first encoded into a many-body-entangled state spread across the lattice, and then decoded back onto the desired final-destination qubit. The intermediate entangled state is GHZ-like state, which has a lot of sensor and clock applications.

FLC Link: https://www.federallabs.org/technology/fast-entangled-state-generation-and-quantum-information-transfer-in-quantum-systems-with

Inventor: Alexey V. Gorshkhov, Michael Foss-Feig, Zachary Eldredge, Ali Hamed Moosavian, Jeremy Young, Zhe-Xuan Gong

Expiration Date: 11/2/2037

 

APPARATUS FOR ELECTRON REFLECTOMETRY

Patent Number: 10424458

Description: Coming soon

FLC Link: https://www.federallabs.org/technology/electron-reflectometer-and-process-for-performing-shape-metrology

Inventor: Lawrence H. Friedman, Wen-Li Wu

Expiration Date: 5/13/2038

Created January 10, 2020, Updated April 2, 2020