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Patent of the Month: April 2021
Patent Description
NIST has developed a device that uses multiple wavelengths (colors) of light and/or multiple species of gas to independently measure the distortions imposed on an optical cavity, cell, or other optical element that holds gas due to the forces applied by the gas. The device measures differences between index of refraction of multiple gases or multiple wavelengths or a combination. Appropriate combinations can be used to independently measure the distortions of an optical cavity filled with gas.
Inventors
Zeeshan Ahmed
Kevin O. Douglass
Stephen P. Eckel
Patrick F. Egan
Jay H. Hendricks
Jack A. Stone Jr.
Technology Types
Optical Technology
Photon Physics
Precision Measurement
Benefits
While existing technology require calibration, this device does not need calibrating.