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Search Publications by: John D. Gillaspy (Fed)

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EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap

March 27, 2007
Author(s)
K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M. Pomeroy, Joseph N. Tan, John D. Gillaspy
At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was observed