Analysis of Broadband X-Ray Spectra of Highly Charged Krypton From a Microcalorimeter Detector of an Electron-Beam Ion Trap

Published

April 1, 2001

Author(s)

I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, N. Madden, D Landis, J. Beeman, E. E. Haller

Abstract

Spectra of highly charged Kr ions, produced in an EBIT, have been recorded in a broad x-ray energy band (0.3-4 keV) with a microcalorimeter detector. Most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition energies have been determined to 0.2% accuracy. An EBIT plasma model has been created and used to calculate a synthetic spectrum of highly charged Kr as well as to determine a charge state distribution of Kr ions inside the EBIT.32.30Rj, 34.50.Fa, .34.80.Dp, 32.70.Fw

Citation

Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)

Volume

63

Issue

No. 4

Pub Type

Journals

Keywords

EBIT, highly charged ions, microcalorimeter, x-ray spectra

Citation

Kink, I. , Laming, J. , Takacs, E. , Porto, J. , Gillaspy, J. , Silver, E. , Schnopper, H. , Bandler, S. , Barbera, M. , Brickhouse, N. , Murray, S. , Madden, N. , Landis, D. , Beeman, J. and Haller, E. (2001), Analysis of Broadband X-Ray Spectra of Highly Charged Krypton From a Microcalorimeter Detector of an Electron-Beam Ion Trap, Physical Review E (Statistical, Nonlinear, and Soft Matter Physics) (Accessed October 11, 2025)