Gillaspy, J.
, Ratliff, L.
, Roberts, J.
and Takacs, E.
(2002),
Highly Charged Ions: Publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.972
(Accessed December 7, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Highly Charged Ions: Publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland
Published
Author(s)
, , , E Takacs
Abstract
Assembled here are the publications of NIST Electron Beam Ion Trap (EBIT) project, from its inception through the end of 2001. They are grouped thematically, as indicated in the table of contents. In order to address some of the most frequently asked questions that are not fully answered in the papers themselves (When did this work begin? How much did it cost? Who worked on it?), a historical introduction is included. Other introductory material can be found on our Web site at http://physics.nist.gov/ebit.Citation
Special Publication (NIST SP) - 972
Report Number
972
Volume
sp972
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
EBIT, highly charged ions, ion cloud, ion-surface, ions, nanotechnology, surfaces, trapped ions, x-ray astronomy
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 2002, Updated November 10, 2018