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Highly Charged Ions: Publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland

Published

Author(s)

John D. Gillaspy, L P. Ratliff, J R. Roberts, E Takacs

Abstract

Assembled here are the publications of NIST Electron Beam Ion Trap (EBIT) project, from its inception through the end of 2001. They are grouped thematically, as indicated in the table of contents. In order to address some of the most frequently asked questions that are not fully answered in the papers themselves (When did this work begin? How much did it cost? Who worked on it?), a historical introduction is included. Other introductory material can be found on our Web site at http://physics.nist.gov/ebit.
Citation
Special Publication (NIST SP) - 972
Report Number
972
Volume
sp972

Keywords

EBIT, highly charged ions, ion cloud, ion-surface, ions, nanotechnology, surfaces, trapped ions, x-ray astronomy

Citation

Gillaspy, J. , Ratliff, L. , Roberts, J. and Takacs, E. (2002), Highly Charged Ions: Publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.972 (Accessed April 17, 2024)
Created July 1, 2002, Updated November 10, 2018