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In Situ Imaging of Highly Charged Ion Irradiated Mica



L P. Ratliff, John D. Gillaspy


We have studied the modification of mica surfaces due to the impact of Xe44+ ions by imaging the ion-exposed surfaces with atomic force microscopy in vacuum. By incorporating the microscope into the vacuum chamber where the samples are exposed to the ions, we rule out posterior modification of these features in air. The features, raised bumps approximately 20 nm in diameter, are similar to those imaged previously in air, however, their heights appear to be larger than previously reported.
Aip Conference Proceedings


AFM, highly charged ion, mica


Ratliff, L. and Gillaspy, J. (2001), In Situ Imaging of Highly Charged Ion Irradiated Mica, Aip Conference Proceedings (Accessed April 20, 2024)
Created January 1, 2001, Updated February 17, 2017