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In Situ Imaging of Highly Charged Ion Irradiated Mica

Published

Author(s)

L P. Ratliff, John D. Gillaspy

Abstract

We have studied the modification of mica surfaces due to the impact of Xe44+ ions by imaging the ion-exposed surfaces with atomic force microscopy in vacuum. By incorporating the microscope into the vacuum chamber where the samples are exposed to the ions, we rule out posterior modification of these features in air. The features, raised bumps approximately 20 nm in diameter, are similar to those imaged previously in air, however, their heights appear to be larger than previously reported.
Citation
Aip Conference Proceedings

Keywords

AFM, highly charged ion, mica

Citation

Ratliff, L. and Gillaspy, J. (2001), In Situ Imaging of Highly Charged Ion Irradiated Mica, Aip Conference Proceedings (Accessed April 20, 2024)
Created January 1, 2001, Updated February 17, 2017