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Displaying 1 - 9 of 9

Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

September 30, 2022
Author(s)
Papa Amoah, Joseph J. Kopanski, Yaw S. Obeng, Christopher Sunday, Chukwudi Okoro, Lin You, Dmirty Veksler
In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. We introduce a suite of non-destructive metrologies that can serve as early

Broadband Dielectric Spectroscopic Detection of Ethanol: A Side-by-Side Comparison of ZnO and HKUST-1 MOFs as Sensing Media

June 25, 2022
Author(s)
Papa Amoah, Pentao Lin, Zeinab Mohammed Hassan, Rhonda Franklin, Engelbert Redel, Helmut Baumgart, Yaw S. Obeng
Changes in the chemo-electrical intrinsic properties of metal-oxide materials (MO) are commonly used as the basis of gas sensors. The most common gas sensors are based on chemically induced changes in electrical resistivity which necessarily involve making

Broadband Microwave Signal Dissipation in Nanostructured Copper Oxide at Air/Film Interface

September 17, 2020
Author(s)
Yaw S. Obeng, Papa K. Amoah, Christopher E. Sunday, Jesus Perez, Uros Cvelbar, Martin Kosicek
Contactless broadband microwave spectroscopic technique (a.k.a., broadband dielectric spectroscopy (BDS)) enables the accurate operando analysis of the electrical and magnetic properties applying without compromising the kinetic conditions of the

Microwave Monitoring of Atmospheric Corrosion of Interconnects

December 28, 2018
Author(s)
Papa Amoah, Dmitry Veksler, Christopher E. Sunday, Stephane Moreau, David Bouchu, Yaw S. Obeng
Traditional metrology has been unable to adequately address the reliability needs of emerging integrated circuits at the nano scale; thus, new metrology and techniques are needed. In this paper, we use microwave propagation characteristics (insertion