October 12, 1998
Author(s)
Y. M. Habib, D. E. Oates, G. Dresselhaus, M. Dresselhaus, Leila R. Vale, Ronald H. Ono
Microwave-frequency (rf) power-dependence measurements performed on thin-film Yba 2Cu 3O^d7-δ grain boundaries engineered on sapphire bicrystal substrates with misorientation angles of θ=20, 50, 100, and 240 are presented. The data are compared to