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Search Publications by: Paul D. Hale (Fed)

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Displaying 126 - 150 of 231

Terminology for High-Speed Sampling-Oscilloscope Calibration

December 1, 2006
Author(s)
Dylan Williams, Tracy S. Clement, Paul D. Hale, Andrew Dienstfrey
We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to

Minimum-Phase Calibration of Sampling Oscilloscopes

August 15, 2006
Author(s)
Andrew M. Dienstfrey, Paul D. Hale, Darryl A. Keenan, Tracy S. Clement, Dylan F. Williams
We describe an algorithm for determining the minimum phase of a linear time-invariant response function from its magnitude. The procedure is based on Kramers Kronig relations in combination with auxiliary direct measurements of the desired phase response

Calibration of Sampling Oscilloscopes With High-Speed Photodiodes

August 1, 2006
Author(s)
Tracy S. Clement, Paul D. Hale, Dylan Williams, C. M. Wang, Andrew Dienstfrey, Darryl A. Keenan
We calibrate the magnitude and phase response of equivalent-time sampling oscilloscopes to 110 GHz. We use a photodiode that has been calibrated with our electrooptic sampling system as a reference input pulse source to the sampling oscilloscope. We

Minimum-phase calibration of sampling oscilloscopes

August 1, 2006
Author(s)
Andrew Dienstfrey, Paul D. Hale, Darryl A. Keenan, Tracy S. Clement, Dylan Williams
We describe an algorithm for determining the minimum phase of a linear, time-invariant response function from its magnitude. The procedure is based on Kramers-Kronig relations in combination with auxiliary direct measurements of the desired phase response

Sampling-Oscilloscope Measurement of a Microwave Mixer With Single-Digit Phase Accuracy

March 1, 2006
Author(s)
Dylan F. Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A. Remley, Joel Dunsmore, Paul D. Hale, Jack Wang, Tracy S. Clement
We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time-base

Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System

January 1, 2006
Author(s)
Dylan F. Williams, Arkadiusz C. Lewandowski, Tracy S. Clement, C. M. Wang, Paul D. Hale, Juanita M. Morgan, Darryl A. Keenan, Andrew Dienstfrey
We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the

Electromagnetic Signatures of WLAN Cards and Network Security

December 21, 2005
Author(s)
Catherine A. Remley, Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Paul D. Hale, Michael McKinley, Emmanouil Antonakakis, A Karygiannis
The proliferation of wireless devices and the availability of new wireless applications and services raise new privacy and security concerns. Although network-layer anonymity protects the identities of the communication endpoints, the physical layer of

Calibrated 200 GHz Waveform Measurement

April 1, 2005
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement
We develop a method for mismatch-correcting temporal waveforms measured with a high-speed electro-optic sampling system. The new calibration characterizes the source in both the time and frequency domains, and accounts for all impedances and multiple

NIST Optoelectronic Measurements for Fiber Optic Applications

March 1, 2005
Author(s)
Kent B. Rochford, Paul D. Hale, Nathan R. Newbury
We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors and instrumentation using electro-optic sampling, and improving wavelength metrology using

Uncertainty of the NIST Electrooptic Sampling System

December 1, 2004
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement
We present an uncertainty analysis of measurements performed with NIST's electrooptic sampling system. The system measures the voltage waveform injected by a photodetector on a coplanar waveguide fabricated on an electrooptic LiTaO3 wafer. The frequency

Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals

October 1, 2003
Author(s)
Kevin J. Coakley, Chih-Ming Wang, Paul D. Hale, Tracy S. Clement
We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before estimating

Calibrated Measurement of Optoelectronic Frequency Response

April 1, 2003
Author(s)
Paul D. Hale, Dylan Williams
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.