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Search Publications by: Paul D. Hale (Fed)

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Displaying 101 - 125 of 231

Traceable waveform calibration with a covariance-based uncertainty analysis

October 1, 2009
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Arkadiusz C. Lewandowski, Tracy S. Clement, Darryl A. Keenan
We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in themeasured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the

Uncertainty of timebase corrections

October 1, 2009
Author(s)
Chih-Ming Wang, Paul D. Hale, Dylan F. Williams
We develop a covariance matrix describing the uncertainty of a new timebase for waveform measurements determined with the National Institute of Standards and Technology's timebase correction algorithm. This covariance matrix is used with covariance

Novel nano-structured Metal-Semiconductor-Metal photodetector with high peak voltage

June 22, 2009
Author(s)
Paul D. Hale, Dylan F. Williams, Tomoko Borsa, B. J. VanZeghbroeck
A novel nano-structured metal-semiconductor-metal photodetector consisting of interdigitated metal fingers and nanodots is successfully fabricated on a semi-insulating GaAs substrate by electron beam lithography, and integrated with an on-chip ground

A transmitter for calibrating the extinction ratio of optical receivers

March 20, 2009
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Paul D. Hale, Klaus M. Engenhardt, Alan Willner
We describe a transmitter being developed at the National Institute of Standards and Technology for calibrating extinction ratio measurements of optical receivers. Preliminary measurement results are presented, and major uncertainty components are

Calculation of pulse parameters and propagation of uncertainty

March 1, 2009
Author(s)
Paul D. Hale, Chih-Ming Wang
The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of each

A robust algorithm for eye-diagram analysis

November 1, 2008
Author(s)
Jeffrey A. Jargon, Paul D. Hale, Chih-Ming Wang
We present a new method for analyzing eye diagrams that always provides a unique solution by making use of a robust, least-median-of-squares (LMS) location estimator. In contrast to commonly used histogram techniques, the LMS procedure is insensitive to

Complete waveform characterization at NIST

June 8, 2008
Author(s)
Paul D. Hale, Tracy S. Clement, Darryl A. Keenan, Dylan F. Williams, Arkadiusz C. Lewandowski, C. M. Wang, Andrew Dienstfrey
We present a method for calibrating the voltage a pulse generator delivers to a load at every point in the measured waveform epoch. The calibration includes an equivalent circuit model of the generator so that the user can calculate how the generator will

Comb-Generator Characterization

February 1, 2008
Author(s)
Howard C. Reader, Dylan Williams, Paul D. Hale, Tracy S. Clement
We characterize a 50 GHz comb generator measured on a sampling oscilloscope. With careful control of the input power, input harmonics and comb generator temperature, we find the output spectrum to be stable to 0.1 dB and 0.5 degrees. We correct results for

Absolute Magnitude and Phase Calibrations

October 1, 2007
Author(s)
Kate Remley, Paul D. Hale, Dylan Williams
In VNA measurements, the magnitude and phase of a transmitted or reflected wave are measured relative to that of the incident wave. VNA measurements are made a single frequency at a time and each frequency component is acquired relative to the internally

Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration

September 1, 2007
Author(s)
Dylan Williams, Tracy S. Clement, Kate Remley, Paul D. Hale, F. Verbeyst
We use traceable swept-sine and electrooptic-sampling-system-based-sampling-oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to

The Sampling Oscilloscope as a Microwave Instrument

August 1, 2007
Author(s)
Dylan Williams, Paul D. Hale, Kate Remley
Many modern high-speed oscilloscopes are well suited for precise microwave waveform, modulated-signal, and nonlinear measurements. These oscilloscopes have bandwidths of up to 100 GHz and are available with nominally 50 ? input impedances. Like their low

Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes

December 1, 2006
Author(s)
Paul D. Hale, C. M. Wang, Dylan Williams, Kate Remley, Joshua Wepman
In this paper, a method of correcting both random and systematic timebase errors using measurements of only two quadrature sinusoids made simultaneously with a waveform of interest is described. The authors estimate the fundamental limits to the procedure