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Displaying 51 - 75 of 190

Noise-parameter measurement with automated variable terminations

June 8, 2008
Author(s)
Dazhen Gu, Dave K. Walker, James P. Randa
NIST has upgraded its measurement capability of noise parameters on low-noise amplifiers with a variable termination unit in the 1 to 12.4 GHz range. Such a unit allows improved time efficiency in the noise-temperature measurements used to de-embed noise

Uncertainty Analysis for Noise-Parameter Measurements

June 8, 2008
Author(s)
James P. Randa
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave

Uncertainty Analysis for NIST Noise-Parameter Measurements

March 31, 2008
Author(s)
James P. Randa
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the

STANDARDS DEVELOPMENT FOR REMOTE SENSING AT MICROWAVE AND TERAHERTZ FREQUENCIES

September 7, 2007
Author(s)
James P. Randa, Eyal Gerecht, Dave K. Walker, Amanda Cox, Dazhen Gu, Lixing You, Robert L. Billinger
The Noise Project in the Electromagnetics Division of the National Institute of Standards and Technology (NIST) has proposed the development of standards for microwave brightness temperature, for use in remote-sensing applications such as satellite-based

On-Wafer Measurement of Transistor Noise Parameters at NIST

April 1, 2007
Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.

Proposal for Development of a National Microwave Brightness-Temperature Standard

September 1, 2006
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker
We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The proposal is a combined standard that would comprise both a standard radiometer, traceable to

Proposed Development of a National Standard for Microwave Brightness Temperature

August 4, 2006
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker
We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The proposal is a combined standard that would comprise both a standard radiometer, traceable to

On-Wafer Noise-Parameter Measurements at NIST

July 14, 2006
Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor

Terahertz radiometer design for traceable noise-temperature measurements

July 14, 2006
Author(s)
Eyal Gerecht, Dazhen Gu, James P. Randa, Dave K. Walker, Robert L. Billinger
We report on design of a radiometer for traceable noise-temperature measurements at terahertz frequencies, including noise measurements on cryogenic IF components, development and test of quasi-optical adapter technology, development of black body

Reverse Noise Measurement and Use in Device Characterization

June 10, 2006
Author(s)
James P. Randa, Tom McKay, Susan L. Sweeney, Dave K. Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check

Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K

March 1, 2006
Author(s)
James P. Randa, Eyal Gerecht, Dazhen Gu, Robert L. Billinger
We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the
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