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Displaying 51 - 75 of 95

Noise Parameter Uncertainties from Monte Carlo Simulations

November 8, 2001
Author(s)
James P. Randa, Wojciech Wiatr
We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlying

Noise Characterization of Multiport Amplifiers

October 1, 2001
Author(s)
James P. Randa
I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise figure

International Comparison, Final Summary Report

November 1, 2000
Author(s)
James P. Randa
An international comparison of noise temperature of coaxial (GPC-7) sources at 2 GHz, 4 GHz and 12 GHz has been completed. Participating laboratories included the Physikalisch-Technische Bundesanstalt (PTB); the Bureau National de Metrologie-Laboratoire

Multiport Noise Characterization and Differential Amplifiers

June 1, 2000
Author(s)
James P. Randa
I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. The noise figure

Noise-Source Stability Measurements

May 1, 2000
Author(s)
James P. Randa, L. A. Terrell, Lawrence P. Dunleavy
We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week and about 1 year or more. Drifts in noise temperature were typically less than the uncertainty of

Design and Testing of NFRad - A New Noise Measurement System

March 1, 2000
Author(s)
Chriss A. Grosvenor, James P. Randa, Robert L. Billinger
The NIST Noise project has constructed and tested a new, automated, coaxial (GPC-7) radiometer for the measurement of noise sources in the 8-12 GHz frequency band. It is an isolated, total-power radiometer that relies on lookup tables for relevant

On-Wafer Measurements of Noise Temperature

December 1, 1999
Author(s)
James P. Randa, Robert L. Billinger
The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results of

Characterization and Applications of On-Wafer Diode Noise Sources

December 1, 1998
Author(s)
Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz

July 1, 1998
Author(s)
James P. Randa, J. Achkar, F. I. Buchholz, T. Colard, D. Schubert, M. Sinclair, John Rice, G. S. Williams
We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All results

Characterization of On-Wafer Diode Noise Sources

June 1, 1998
Author(s)
James P. Randa, Dave K. Walker, Lawrence P. Dunleavy, Robert L. Billinger, John Rice
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer

Uncertainties in NIST Noise-Temperature Measurements

March 1, 1998
Author(s)
James P. Randa
Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 to 12

Noise-Temperature Measurement System for the WR-28 Band

August 1, 1997
Author(s)
James P. Randa, L. A. Terrell
The NIST Noise Project has constructed and tested a radiometer for the measurement of noise sources in the WR-28 waveguide band (26.5 GHz to 40 GHz). It is a total-power radiometer which incorporates a six-port reflectometer for the measurement of relevant
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