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Displaying 26 - 50 of 70

Use of Electronic Calibration Units for Vector-Network-Analyzer Verification

July 30, 2010
Author(s)
Dylan F. Williams, Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley, Chih-Ming Wang, Jolene D. Splett
We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network

A New Electronic Verification Method for Vector Network Analyzers

June 13, 2010
Author(s)
Ronald A. Ginley, Dylan F. Williams, Denis X. LeGolvan
The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several

Towards Standardized Waveguide Sizes and Interfaces for Submillimeter Wavelengths

March 22, 2010
Author(s)
Ronald A. Ginley, Dylan Williams, N M. Ridler, J L. Hesler, Anthony R. Kerr, R D. Pollard
This paper describes an activity that has begun recently to develop an international standard for rectangular metallic waveguides and their interfaces for frequencies of 110 GHz and above. The IEEE's Microwave Theory and Techniques Society (MTT-S) is

Electronic Vector-Network-Analyzer Verification

October 1, 2009
Author(s)
Dylan F. Williams, Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley
The National Institute of Standards and Technology (NIST) has just introduced a fully electronic measurement verification system for microwave vector-network-analyzer (VNA) calibrations called NISTeVerify. The system allows you to quickly verify VNA

Wideband measurement of extreme impedance with a multistate reflectometer

December 12, 2008
Author(s)
Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley, Thomas M. Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We

NIST Microwave Scattering Parameter and Power Measurement Services

September 30, 2007
Author(s)
Ronald A. Ginley
This paper describes the microwave scattering parameter (s-parameter) and power measurement services available at NIST. This includes what is measured in each of the services, the techniques used for both calibration of the systems and subsequent

Leakage Effects in Microwave Power Measurements

January 26, 2007
Author(s)
Ronald A. Ginley, Denis X. LeGolvan, Ann F. Monke
Because microwave power measurements are used to support almost every segment of the microwave electronics industry, the accuracy of these measurements is critical. Recently, we have several different problems that affect microwave power measurements which

Leakage Effects on Microwave Power Measurements

January 26, 2007
Author(s)
Ronald A. Ginley, Denis X. LeGolvan, Ann F. Monke
Microwave power measurements are used to support almost every every segment of the microwave electronics industry. It is very important for these measurements to be as accurate as possible. Recently we have found several different problems that affect
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