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Confidence Through Comparing Vector Network Analyzer Measurements - The ARFTG Measurement Comparison Program

Published

Author(s)

Ronald A. Ginley

Abstract

This paper describes the ARFTG scattering parameter Measurement Comparison Program (MCP) which is supported by NIST. The ARFTG MCP is designed specifically to allow users of vector network analyzers to compare their measurements to those of their peers. The paper describes the purpose of the ARFTG MCP, what the MCP actually is with regards to devices, measurements and data processing, a brief history of the ARFTG MCP and finally a discussion of the data analysis and presentation methods used by the MCP.
Citation
IEEE Microwave Magazine
Volume
8
Issue
4

Keywords

ARFTG, measurement comparison, scattering parameters, vector network analyzers

Citation

Ginley, R. (2007), Confidence Through Comparing Vector Network Analyzer Measurements - The ARFTG Measurement Comparison Program, IEEE Microwave Magazine, [online], https://doi.org/10.1109/MMW.2007.383953 (Accessed December 2, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 2007, Updated January 27, 2020