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Displaying 1 - 25 of 70

Qualitative Multidimensional Calibration Comparison

January 15, 2018
Author(s)
Aric W. Sanders, Ronald A. Ginley, Christian J. Long, Jasper A. Drisko, Nathan D. Orloff, Richard A. Chamberlin
We present a technique for the visual comparison of any two vector network analyzer calibrations. This method visualizes the comparative action of the calibrations for multiple complex scattering parameters relative to the calibrated measurement plane

Establishing Traceability for SOLT Calibration Kits*

November 28, 2017
Author(s)
Ronald A. Ginley
Establishing traceability for a measurement is very important so that the results of the measurement can be used in a common framework for comparisons and understanding. The standard source of traceability for Short-Open-Load-Thru (SOLT) calibrations has

Kicking the Tires of the NIST Microwave Uncertainty Framework Part 2*

November 27, 2017
Author(s)
Ronald A. Ginley
Traceability of a measurement requires two parts. An unbroken chain of measurements and uncertainties for each link of the chain. The NIST Microwave Uncertainty Framework (MUF) can provide both the required parts for a single link in the chain or for

Efficient Rectangular Waveguide to Stripline Transition in D Band

August 7, 2017
Author(s)
Dazhen Gu, Xifeng Lu, Ronald A. Ginley
We present a waveguide-to-stripline transition for a full {\it D}-band operation from 110 GHz to 170 GHz. An E-plane probe in parallel with waveguide main axis is configured to effectively couple the signal in the primary $\text{TE}_{10}$ mode from the

A Review of the IEEE 1785 Standards for Rectangular Waveguides above 110 GHz

June 6, 2017
Author(s)
Ronald A. Ginley, Nick M. Ridler
A new series of standards has recently been published by IEEE defining waveguide for use at millimeter-wave and terahertz frequencies. The series comprises three standards covering different aspects of this technology: (i) frequency bands and waveguide

Kicking the Tires of the NIST Microwave Uncertainty Framework,

December 8, 2016
Author(s)
Ronald A. Ginley
As with anything new, especially metrology tools, you want to know how good the new tool is. This is generally done through comparisons with existing systems. In this paper such a comparison is described. The new NIST method of processing measurements and

Traceability for Microwave Power Measurements: Past, Present, and Future

April 13, 2015
Author(s)
Ronald A. Ginley
The need for traceable microwave power measurements for use in communications, defense, spectral line investigation, molecular particle signature identification, material property characterization and others is well established. Traceability for power

Traceability for Millimeter and Submillimeter-Wave Power Measurements

May 21, 2014
Author(s)
Ronald A. Ginley
The need for traceable power measurements above 110 GHz is well established for use in communications, spectral line investigation, molecular particle signature identification, material property characterization and others. There have been incremental

A Direct Comparison System for Power Calibration up to 67 GHz*

July 1, 2012
Author(s)
Thomas M. Wallis, Thomas P. Crowley, Denis X. LeGolvan, Ronald A. Ginley
A direct comparison system for calibration of power sensors with 1.85 mm precision coaxial connectors up to 67 GHz has been developed. The comparison is implemented in two frequency bands. Between 10 MHz and 50 GHz, power sensors with 2.4 mm coaxial

Standardizing Rectangular Metallic Waveguides for Terahertz Applications

July 1, 2012
Author(s)
Ronald A. Ginley, N M. Ridler
This paper describes an on-going activity to develop an international document standard for defining rectangular metallic waveguides for use in the submillimeter-wave/terahertz frequency range. The IEEE's Microwave Theory & Techniques Society (MTT-S) is

Recent Developments in Millimeter and Submillimeter Metrology at NIST

June 30, 2011
Author(s)
Ronald A. Ginley
The millimeter and submillimeter frequency ranges are becoming very important to today’s electronics, security and communication industries. NIST has undertaken a research program to aggressively pursue this area. This paper will cover the millimeter
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