Aric W. Sanders, Ronald A. Ginley, Christian J. Long, Jasper A. Drisko, Nathan D. Orloff, Richard A. Chamberlin
We present a technique for the visual comparison of any two vector network analyzer calibrations. This method visualizes the comparative action of the calibrations for multiple complex scattering parameters relative to the calibrated measurement plane. This method is independent of the calibration model. This comparative visualization of the two calibrations facilitates quick assessment of different calibration and error models, guides the choice of verification standards for later comparison, creates an easy way to monitor instrument stability over time, and can help guide the development of new on wafer calibration schemes.
, Ginley, R.
, Long, C.
, Drisko, J.
, Orloff, N.
and Chamberlin, R.
Qualitative Multidimensional Calibration Comparison, 90th ARFTG Microwave Measurement Conference, boulder, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924650
(Accessed September 26, 2023)