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Leakage Effects in Microwave Power Measurements

Published

Author(s)

Ronald A. Ginley, Denis X. LeGolvan, Ann F. Monke

Abstract

Because microwave power measurements are used to support almost every segment of the microwave electronics industry, the accuracy of these measurements is critical. Recently, we have several different problems that affect microwave power measurements which include leakage, compensation bead bias conditions, and common mode noise. One of the main problems is leakage of microwave energy through the microwave power sensors. This paper explores some of the effects this leakage energy has on different parts of microwave power measurements systems and the power measurement process and discusses possible ways of handling the errors associated with energy.
Citation
NCSL International Measure

Keywords

effective efficiency, leakage, microwavepower, reflection coefficient

Citation

Ginley, R. , LeGolvan, D. and Monke, A. (2007), Leakage Effects in Microwave Power Measurements, NCSL International Measure (Accessed April 24, 2024)
Created January 26, 2007, Updated January 27, 2020