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Search Publications by: Yoshi Ohno (Fed)

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Displaying 76 - 100 of 197

Calibration and Standardization Issues of UV Sensors for Water Disinfection

August 1, 2005
Author(s)
Thomas C. Larason, Yoshihiro Ohno
Ultraviolet radiation (UV) effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia and most bacterial pathogens. Water treatment facilities recently started using ultraviolet radiation for disinfection

Toward an Improved Color Rendering Metric

July 13, 2005
Author(s)
Wendy L. Davis, Yoshihiro Ohno
Several aspects of the Color Rendering Index (CRI) are flawed, limiting its usefulness in assessing the color rendering capabilities of LEDs for general illumination. At NIST, we are developing recommendations to modify the CRI that would overcome these

A Flexible Bandpass Correction Method for Spectrometers

May 13, 2005
Author(s)
Yoshihiro Ohno
An improved method for the correction of bandpass errors in spectrometers has been developed. This method is an improvement over the Stearns and Stearns method, which is limited in use to a triangular bandpass function and requires the bandwidth be matched

NIST Facility for Color Rendering Simulation

May 13, 2005
Author(s)
Wendy L. Davis, J L. Gardner, Yoshihiro Ohno
The color rendering index (CRI) does not adequately assess the color rendering properties of solid-state light sources. An improved metric will be critical to the development of such new light sources for general lighting applications. A facility for color

Living With Uncertainty

February 1, 2005
Author(s)
Carl C. Miller, Yoshihiro Ohno
This article discusses measurement uncertainty. Definitions that are used in describing measurement uncertainty along with terms that should not be used. The significance and the procedure for calculating measurement uncertainty are presented.

Standardization of LED Measurements Updates

September 15, 2004
Author(s)
Carl C. Miller, Yoshihiro Ohno
The article describes the current LED standards and recommendations. It also discusses the work in Commission Internationale De L Eclairage Technical Committees to form new recommendations for LED measurements of total luminous flux, partial LED flux and