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LED Photometric Calibrations at the National Institute of Standards and Technology and Future Measurement Needs of LEDs

Published

Author(s)

Carl C. Miller, Yuqin Zong, Yoshihiro Ohno
Proceedings Title
Proceedings of the SPIE 49th Annual Meeting
Volume
SPIE Vol. 5530
Conference Dates
August 2-6, 2004
Conference Title
SPIE

Keywords

average LED intensity, calibration standard, LED, luminous flux, total radiant flux, UV LED

Citation

Miller, C. , Zong, Y. and Ohno, Y. (2004), LED Photometric Calibrations at the National Institute of Standards and Technology and Future Measurement Needs of LEDs, Proceedings of the SPIE 49th Annual Meeting, [online], https://doi.org/10.1117/12.566635 (Accessed May 20, 2024)

Issues

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Created October 20, 2004, Updated November 10, 2018