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Search Publications by: Dean G. Jarrett (Fed)

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Displaying 26 - 50 of 97

AC and DC Quantized Hall Array Resistance Standards

August 28, 2020
Author(s)
Randolph E. Elmquist, Mattias Kruskopf, Dinesh K. Patel, I Fan Hu, Chieh-I Liu, Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett
Quantized Hall array resistance standards (QHARS) span values from 100 (ohm) to 1 M(ohm) and demonstrate precision approaching that of single devices. This paper focuses on QHARS having values near 1 k(ohm) for increased sensitivity using room-temperature

Evaluation of an alternative null detector for adapted Wheatstone bridge

August 24, 2020
Author(s)
Shamith U. Payagala, Alana M. Dee, Dean G. Jarrett
The adapted Wheatstone bridge technique has been utilized at National Institute of Standards and Technology (NIST) and other National Metrology Institutes (NMIs) for high resistance measurements. In this work, we evaluate the suitability of a

Evaluation of NMIJ Traveling Dual Source Bridge Using NIST Adapted Wheatstone Bridge

August 24, 2020
Author(s)
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the resistance ratio by measuring the voltage ratio using a digital multimeter, 3458A. Based on the

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA

Advanced Temperature-Control Chamber for Resistance Standards

April 10, 2020
Author(s)
Shamith Payagala, Alireza Panna, Albert Rigosi, Dean G. Jarrett
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard resistors. Despite the high quality of these methods, there still exist inherent limitations to the

Comparison of Multiple Methods for Obtaining PO Resistances with Low Uncertainties

September 3, 2019
Author(s)
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies

10 T? and 100 T? Resistance Comparison between NIST and AIST

July 9, 2018
Author(s)
Dean G. Jarrett, Takehiko Oe, Nobu Kaneko, Shamith U. Payagala
We report the results of a comparison of 10 TΩ and 100 TΩ high resistance standards between the National Institute of Standards and Technology (NIST) and the National Institute for Advanced Industrial Science and Technology (AIST). Three standard resistors

Epitaxial Graphene p-n Junctions

July 9, 2018
Author(s)
Jiuning Hu, Mattias Kruskopf, Yanfei Yang, Bi Y. Wu, Jifa Tian, Alireza R. Panna, Albert F. Rigosi, Hsin Y. Lee, George R. Jones Jr., Marlin E. Kraft, Dean G. Jarrett, Kenji Watanabe, Takashi Taniguchi, Randolph E. Elmquist, David B. Newell
We report the fabrication and measurement of top gated epitaxial graphene p-n junctions where exfoliated hexgonal boron nitride (hBN) is used as the gate dielectric. The four terminal longitudinal resistance across a single junction is well quantized at R_

Transport of NIST Graphene Quantized Hall Devices and Comparison with AIST Gallium-Arsenide Quantized Hall Devices

July 9, 2018
Author(s)
Dean G. Jarrett, Takehiko Oe, Randolph E. Elmquist, Nobu Kaneko, Albert F. Rigosi, Bi Y. Wu, Hsin Y. Lee, Yanfei Yang
We report the results of a pilot study where two graphene quantized Hall resistance (QHR) devices made at the National Institute of Standards and Technology (NIST) were hand carried from the USA to the National Institute for Advanced Industrial Science and

A Table-Top Graphene Quantized Hall Standard

July 8, 2018
Author(s)
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, George R. Jones Jr., Marlin E. Kraft, Mattias Kruskopf, Bi Y. Wu, Hsin Y. Lee, Yanfei Yang, Dean G. Jarrett, Randolph E. Elmquist, David B. Newell
We report the performance of a quantum standard based on epitaxial graphene maintained in a 5 T table-top cryocooler system. The ν = 2 resistance plateau, with a value of RK-90/2, is used to scale to 1 kΩ, allowing comparisons of the performance of a

Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges

July 8, 2018
Author(s)
Alireza Panna, Marlin E. Kraft, Albert Rigosi, George R. Jones Jr., Shamith Payagala, Mattias Kruskopf, Dean G. Jarrett, Randolph Elmquist
We describe recent scaling measurements to decade resistance levels based on both cryogenic and non-cryogenic current comparator bridges. National measurement institutes and the International Bureau of Weights and Measures derive traceability for the SI

Fabrication of High Value Standard Resistors for ICE-LMVE

July 10, 2016
Author(s)
Dean G. Jarrett, Isabel Castro, Marlin E. Kraft
In Costa Rica, the Laboratorio Metrológico de Variables Eléctricas (LMVE) at the Instituto Costarricense de Electricidad (ICE) develops and improves measurement capabilities to promote and support the industrial innovation and development in the country

Quantum Hall Resistance Traceability for the NIST-4 Watt Balance

July 10, 2016
Author(s)
Dean G. Jarrett, Randolph Elmquist, Marlin E. Kraft, George R. Jones Jr., Shamith Payagala, Frank Seifert, Stephan Schlamminger, Darine El Haddad
Scaling from the quantum Hall resistance to 100 Ω standard resistors used by the NIST-4 Watt Balance involves multiple resistance standards and bridges to provide the lowest possible uncertainty. Described here is the infrastructure and procedures

Third Generation of Adapted Wheatstone Bridge for High Resistance Measurements at NIST

July 10, 2016
Author(s)
Dean G. Jarrett, Shamith Payagala, Marlin E. Kraft, Kwang Min Yu
A third generation of adapted Wheatstone bridge is being developed at NIST to improve high resistance measurements and scaling from 1 TΩ to 10 PΩ. Improvements to extend range and reduce uncertainties include automated calibration of the voltage sources

A 100 Tohm Guarded Hamon Transfer Standard

August 24, 2014
Author(s)
Dean G. Jarrett, Edward O'Brien, Marlin E. Kraft
Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and guard resistor

Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm

August 24, 2014
Author(s)
Dean G. Jarrett, Gert Rietveld, Beat Jeckelmann
An overview is presented on precision high-ohmic resistance measurements for values of 100 Mohmand above. The two main measurement techniques in this resistance range are discussed, the current integration technique and the adapted Wheatstone bridge. The

10 TOhm and 100 TOhm High Resistance Measurements at NIST

September 25, 2013
Author(s)
Dean G. Jarrett, Marlin E. Kraft
The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used to provide multiple
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