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Metrological Suitability of Functionalized Epitaxial Graphene

Published

Author(s)

Albert F. Rigosi, Mattias Kruskopf, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
Citation
IEEE Transactions on Instrumentation and Measurement

Citation

Rigosi, A. , Kruskopf, M. , Panna, A. , Payagala, S. , Jarrett, D. , Newell, D. and Elmquist, R. (2020), Metrological Suitability of Functionalized Epitaxial Graphene, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929416 (Accessed June 16, 2021)
Created August 31, 2020, Updated June 22, 2020