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Publications

NIST Authors in Bold

Displaying 551 - 575 of 49898

Sources of Errors in Structured Light 3D Scanners

Author(s)
Prem K. Rachakonda, Balasubramanian Muralikrishnan, Daniel S. Sawyer
Structured light (SL) scanners have been commercially available for over a decade and some commercial scanners are evaluated using one of two German guidelines

Indistinguishable single-mode photons from spectrally engineered biphotons

Author(s)
Thomas Gerrits, Adriana E. Lita, Sae Woo Nam, Changchen Chen, Jane Heyes, Kyung-Han Hong, Jeffrey Shapiro, Franco N. Wong
We use pulsed spontaneous parametric down-conversion in KTiOPO4, with a Gaussian phasematching function and a transform-limited Gaussian pump, to achieve near

Reduction of light shifts in Ramsey spectroscopy with a combined error signal

Author(s)
Moshe Shuker, Juniper Wren Y. Pollock, Rodolphe Boudot, V. I. Yudin, A. V. Taichenachev, John E. Kitching, Elizabeth A. Donley
Light-induced frequency shifts can be a key limiting contribution to the mid and long-term frequency stability in atomic clocks. In this letter, we demonstrate

Towards the optical second: verifying optical clocks at the SI limit

Author(s)
William F. McGrew, Xiaogang Zhang, Robert J. Fasano, Holly Leopardi, Daniele Nicolodi, Kyle P. Beloy, Jian Yao, Jeffrey A. Sherman, Stefan A. Schaeffer, Joshua J. Savory, Stefania Romisch, Christopher W. Oates, Thomas E. Parker, Tara M. Fortier, Andrew D. Ludlow
The pursuit of ever more precise measures of time and frequency motivates redefinition of the second in terms of an optical atomic transition. To ensure

Spontaneous current constriction in threshold switching devices

Author(s)
Jonathan M. Goodwill, Georg Ramer, Dasheng Li, Brian D. Hoskins, Georges Pavlidis, Jabez J. McClelland, Andrea Centrone, James A. Bain, Marek Skowronski
Threshold switching devices exhibit extremely non-linear current-voltage characteristics, which are of increasing importance for a number of applications
Displaying 551 - 575 of 49898