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NIST Authors in Bold

Displaying 1476 - 1500 of 1938

Fundamentals of the Reaction-Diffusion Process in Model EUV Photoresists

March 1, 2006
Author(s)
Kristopher Lavery, George Thompson, Hai Deng, D S. Fryer, Kwang-Woo Choi, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Sushil K. Satija, Michael Leeson, Heidi B. Cao
More demanding requirements are being made of photoresist materials for fabrication of nanostructures as the feature critical dimensions (CD) decrease. For EUV resists, control of line width roughness (LWR) and high resist sensitivity are key requirements

Estimation of the Interfacial Adhesion Strength in Compositional Libraries of Epoxy Films

February 22, 2006
Author(s)
Jae Hyun Kim, Martin Y. Chiang, D Kawaguchi, Gareth Royston, Christopher M. Stafford
At the NIST Combinatorial Methods Center (NCMC), we have designed, developed, and demonstrated a combinatorial approach to the edge delamination test to char-acterize the adhesion of thin polymer films. This test is based on fracture of a film/substrate

Dissolution Fundamentals of 193-nm Methacrylate Based Photoresists

February 19, 2006
Author(s)
Ashwin Rao, Shuhui Kang, B D. Vogt, Vivek Prabhu, Eric K. Lin, Wen-Li Wu, Karen Turnquest, W D. Hinsberg
The dissolution of partially deprotected chemically amplified photoresists is the final step in printing lithographic features. Since this process step can be tuned independently from the design of the photoresist chemistry, fundamental measurements of the

Generating Thickness Gradients of Thin Polymer Films via Flow Coating

February 1, 2006
Author(s)
Christopher Stafford, Kristen Roskov, Thomas Epps, Michael J. Fasolka
Thickness is a governing factor in the behavior of films and coatings. To enable the high-throughputanalysis of this parameter in polymer systems, we detail the design and operation of a flow coater device for fabricating continuous libraries of polymer

Mirofluidic Appproach for Rapid Interfacial Tensiometry

February 1, 2006
Author(s)
J Cabral, Steven Hudson
We report a microfluidic instrument to rapidly measure the interfacial tension of multi-component immiscible liquids. The measurement principle rests upon the deformation and retraction dynamics of drops under extensional flow and was implemented in

Effect of Shear Flow on Multi-Component Polymer Mixtures

January 1, 2006
Author(s)
Charles C. Han, Yonghua Yao, C.L. Zhang, Erik K. Hobbie
There is considerable interest in the phase behavior of multi-component polymer mixtures, the so-called polymer blends, due to their broad technological importance in the plastics industry. Traditionally, quiescent conditions have been adopted for

High Throughput Measurement of Peel of a Pressure Sensitive Adhesive

January 1, 2006
Author(s)
P M. McGuiggan, James J. Filliben
The peel force of a pressure sensitive adhesive (PSA) tape is measured on a surface that varied linearly in temperature. As the tape is peeled from the surface, the adhesive is peeled from a surface at a different temperature. The temperature can be

Small Angle Neutron Scattering from Labeled Single Wall Carbon Nanotubes

January 1, 2006
Author(s)
Barry J. Bauer, Erik K. Hobbie, Matthew Becker
Small angle neutron scattering (SANS) is used with the high concentration method to extract single particle scattering from single wall carbon nanotubes (SWNTs). The SWNT material was labeled by covalently attaching -C4H9 or -C4D9 groups by use of free

The influence of molecular weight on the microstructure and thin film transistor characteristics of pBTTT polymers

January 1, 2006
Author(s)
Rick Hamilton, Clare Bailey, Warren Duffy, Martin Heeney, Martin Shkunov, David Sparrowe, Steve Tierney, Iain McCulloch, Regis J. Kline, Dean DeLongchamp, Michael L. Chabinyc
A common strategy to improve the electrical performance of organic field effect transistors is to optimize the charge carrier mobility of the semiconducting thin film. Polymer semiconductor transport properties have shown a dependence on the chain length

Multiscale Modeling of Germanium Quantum Dots in Silicon

December 30, 2005
Author(s)
Vinod Tewary, David T. Read
A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice-statics and continuum Green's functions integrated with classical molecular dynamics. It fully
Displaying 1476 - 1500 of 1938
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