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Search Publications

NIST Authors in Bold

Displaying 1426 - 1450 of 1729

Correlations Between the Magnetic and Structural Properties of Ca Doped BiMnO 3

April 1, 2001
Author(s)
H Woo, T A. Tyson, Mark Croft, S W. Cheong, Joseph Woicik
Bi1-xCaxMnO3 (BCMO) is known to exhibit charge ordering for a much broader range of x than the classicLa1-xCaxMnO3 (LCMO) system. However, the properties of BCMO over the entire doping range are not well understood. We have performed magnetization and

Difficulties Making Reliability Predictions For Si, GaAs, and Inp

April 1, 2001
Author(s)
Grady S. White, L M. Braun
The lifetime prediction model that has been developed for brittle materials implicitly assumes an initial flaw population from which, under the influence of an applied or residual stress, cracks grow to failure. The relationship between crack growth rate

Making MALDI-TOF-MS an Absolute Method for Determination of the MMD of Polymers

April 1, 2001
Author(s)
Charles M. Guttman, William R. Blair, S Wetzel
In 1963, Donald McIntyre of the NBS Polymers Division produced the first polymer molecular mass standards to be issued by NBS as Standard Reference Materials (SRM), SRM 705. The appearance of this SRM marked the beginning of a long and continuing tradition

Mass Spectrometry of Spin-On-Glass Low-K Dielectric Precursors

April 1, 2001
Author(s)
William E. Wallace, Kathleen M. Flynn, Joseph M. Antonucci
The degree-of-intramolecular-condensation, defined as the number of residual silanol (SiOH) groups per oligomer, for a variety of silsesquioxane polymers was measured by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. Reaction

Porous Thin Films for Thermal Barrier Coatings

April 1, 2001
Author(s)
K D. Harris, D Vick, E J. Gonzalez, T Smy, K Robbie, M J. Brett
A new approach is described in the deposition of thin films for thermal barrier applications. In a physical vapour deposition experiment, extreme shadowing, present only at highly oblique flux/substrate angles, was employed to introduce porosity into thin

Structure and Property Characterization of Low-k Dielectric Porous Thin Films

April 1, 2001
Author(s)
Barry J. Bauer, Eric K. Lin, V. J. Lee, Haonan Wang, Wen-Li Wu
High-resolution X-ray reflectivity and small angle neutron scattering measurements are used as complementary techniques to characterize the structure and properties of porous thin films for use as low-k interlevel dielectric (ILD) materials. With the

The Influence of Molecular Architecture and Solvent Type on the Size and Structure of Poly (Bezyl Ether) Dendrimers by SANS

April 1, 2001
Author(s)
G Evmenenko, Barry J. Bauer, R Kleppinger, B Forier, W Dehaen, Eric J. Amis, N Mischenko, H Reynaers
The size of poly(benzyl ether) dendrimers with different molecular architectures was measured by small angle neutron scattering (SANS). Both polar and non-polar solvents were used to measure the effect of solvent type. The radius of gyration (Rg) of all of

Brittle Fracture Versus Quasi Plasticity in Ceramics: A Simple Predictive Index

March 1, 2001
Author(s)
Y W. Rhee, H W. Kim, Y N. Deng, Brian R. Lawn
Simple relations for the onset of competing brittle and quasi plastic damage modes in Hertzian contact are presented. The formulations are expressed in terms of well-documented material parameters, elastic modulus, toughness and hardness, enabling a priori

Development of Low Cost (Sr,Ca) 3 Al 2 O 6 Dielectrics for Bi 2 Sr 2 CaCu 2 O 8+d Applications

March 1, 2001
Author(s)
T J. Haugan, Winnie K. Wong-Ng, Lawrence P. Cook, Richard G. Geyer, H J. Brown, L Swartzendruber, James A. Kaduk
The development of low-cost (Sr,Ca)3Al2O6 dielectrics for Bi2Sr2CaCu2O8+d superconductor applications was investigated. The (Sr,Ca)3Al2O6 phase was determined to be inert to Bi2Sr2CaCu2O8+d with extended high temperature subsolidus annealing, and also

NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis

March 1, 2001
Author(s)
Charles M. Guttman, S Wetzel, William R. Blair, B M. Fanconi, Kathleen M. Flynn, R J. Goldschmidt, William E. Wallace, David L. VanderHart
Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which is

Thermal Conductivity and Thermal Diffusivity of Selected Oxide Single Crystals

March 1, 2001
Author(s)
A Stanimirovic, N M. Balzaretti, A Feldman, J Graebner
Values for the thermal conductivity k and the thermal diffusivity D of four oxide single crystals have been obtained. Near room temperature the values are: LaAlO 3, k = 0.115 Wcm -1K -1, D = 0.0446 cm 2s -1., NdGaO 3, k = 0.068 Wcm -1K -1, D=0.0197 cm 2s

Ceramic Thin Film Measurements and Standards Program Web Page

February 1, 2001
Author(s)
Charles E. Bouldin, Debra Kaiser, Peter K. Schenck
Ceramic materials are increasingly being used in thin film form in electronic, optical, optoelectronic, and magnetic devices. Our program addresses measurements, standards and data needs for a wide variety of application areas, including III-V andIII

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

Broadband Dielectric Relaxation of Polymer Composite Films

January 1, 2001
Author(s)
C. K. Chiang, R Popielarz, R Nozaki, Jan Obrzut
The broadband dielectric relaxation of a BaTiO3-polymer composite film was studied. The complex dielectric constant data from 10 -4 Hz to 10 10 Hz reveals the existence of a relaxation process at a frequency of 10 MHz in the polymer composite. On the basis

Ceramics Division FY 2000 Programs and Accomplishments

January 1, 2001
Author(s)
Stephen W. Freiman, S J. Dapkunas
The mission of the Ceramics Division is: Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the Nation's measurements and standards infrastructure for ceramic materials. The range of ceramic
Displaying 1426 - 1450 of 1729
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