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Displaying 12976 - 13000 of 73697

Chapter 6. Characterization of nanofiber devices

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Previous chapters have introduced and described a variety of measurement techniques for RF nanoelectronic devices. Here, our objective is to work through an illustrative example that highlights strategies and challenges related to implementing a specific

Chapter 7. Probe-based measurement systems

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
In the preceding chapters, we have focused on broadband, calibrated measurements of nanoelectronic devices. In particular, we have described measurement techniques for the measurement of calibrated, complex scattering parameters and the subsequent

Chapter 8. Instrumentation for near-field scanning microwave microscopy

September 17, 2017
Author(s)
Pavel Kabos, Thomas Mitchell (Mitch) Wallis
In the previous chapter, we discussed the underlying physics and theory of operation for near-field scanning microwave microscopes (NSMMs) and related probe-based measurement systems. Here, we consider the practical implementations of such scanning probe

Chapter 9. Radio frequency scanning probe measurements of materials

September 17, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
Preceding chapters have described the near field scanning microwave microscope (NSMM), while discussing both the underlying theory of operation and practical considerations for instrumentation. A primary application area for NSMMs and related microscopes

Chapter 1. An introduction to radio frequency nanoelectronics

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The field of radio frequency (RF) nanoelectronics focuses on the fundamental study and engineering of devices that are enabled by nanotechnology and operate within a frequency range from about 100 MHz to about 100 GHz. This range includes frequencies

Chapter 2. Core concepts of microwave and RF measurements

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
In this chapter we will review the core concepts of microwave and radio frequency (RF) propagation in both guided-wave and on-wafer environments. Because most of these concepts are well-known, we will introduce only the terms and definitions that are

Chapter 3. Extreme Impedance Measurements

September 15, 2017
Author(s)
Pavel Kabos, Thomas Mitchell (Mitch) Wallis
Microwave measurements of RF nanoelectronic devices present numerous challenges. Among these, perhaps the most difficult measurement challenge arises from the inherent, often extreme impedance mismatch between nanolectronic systems and conventional

Chapter 4. On-wafer measurements of RF nanoelectronic devices

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The preceding chapters have introduced the core concepts and techniques of microwave measurements, in general, and techniques for microwave measurements of extreme impedance devices, in particular. Here, we narrow the focus further to on-wafer, microwave

Chapter 5. Modeling and validation of RF nanoelectronic devices

September 15, 2017
Author(s)
Thomas M. Wallis, Pavel Kabos
The development and engineering of nanoelectronic devices has been characterized by several significant technological trends. In addition to the ongoing scaling of feature sizes down to nanoscale dimensions, the need for superior performance has driven the

Polymer Informatics: Opportunities and Challenges

September 15, 2017
Author(s)
Debra J. Audus, Juan J. de Pablo
We are entering an era where large volumes of scientific data, coupled with algorithmic and computational advances, can reduce both the time and cost of developing new materials. This emerging field known as materials informatics has gained acceptance for

Electromagnetic Scattering from Individual Crumpled Graphene Flakes: A Characteristic Modes Approach

September 14, 2017
Author(s)
Edward J. Garboczi, Jack F. Douglas, Luis Fernando Vargas Lara, Ahmed M. Hassan, Deb Chatterjee, Kalyan Durbhakula, Md Gaffar
Graphene flakes in real composites are rarely perfectly flat, and often exhibit complicated crumpled shapes. Therefore, the goal of this work was to quantify the electromagnetic scattering characteristics of individual crumpled graphene flakes with shapes

Time Information Broadcasting

September 14, 2017
Author(s)
John P. Lowe
The National Institute of Standards and Technology (NIST) operates radio station WWVB which broadcasts the official time of the United States. WWVB is a 60 kHz standard frequency broadcast emanating from Ft. Collins, Colorado since 1965. The broadcast

Behaviour of high-strength bolts at elevated temperatures under double-shear loading

September 13, 2017
Author(s)
Mina S. Seif, Jonathan M. Weigand, Rafaela Peixoto, Luiz Vieira
During fire events, connections in steel structures may be subjected to large unanticipated deformations and loads. Those fire effects can produce failures of connections, including local buckling of the connection zone, rupture of connection plates, shear

Black Box Measurement of System Noise in Integrated Wireless Receivers

September 13, 2017
Author(s)
Daniel G. Kuester, Duncan A. McGillivray, Sheryl M. Genco, Dazhen Gu
Tightly-integrated antennas and inaccessible radio frequency (RF) outputs are common barriers to measuring system noise in integrated wireless receive systems. We propose a solution centered on locating "SNR isoresponses" --- processed receiver outputs

Consistent View of Polypeptide Chain Expansion in Chemical Denaturants from Multiple Experimental Methods

September 13, 2017
Author(s)
Alessandro Borgia, Wenwei Zheng, Karin Buholzer, Madeleine Borgia, Anja Schuler, Hagen Hoffman, Andrea Sorrano, Daniel Nettels, Klaus Gast, Alexander Grishaev, Robert Best, Benjamin Schuler
There has been a long-standing controversy regarding the effect of chemical denaturants on the dimensions of unfolded and intrinsically disordered proteins: A wide range of experimental techniques suggest that polypeptide chains expand with increasing

Nanophotonic atomic force microscope transducers enable chemical composition and thermal conductivity measurements at the nanoscale

September 13, 2017
Author(s)
Jungseok Chae, Sangmin An, Georg Ramer, Vitalie Stavila, Glenn Holland, Yohan Yoon, Alec Talin, Mark Allendorf, Vladimir Aksyuk, Andrea Centrone
The atomic force microscope (AFM) offers a rich observation window on the nanoscale, yet many dynamic phenomena are too fast and too weak for direct detection, urging measurement innovation. Integrated cavity-optomechanics is revolutionizing

Non-Uniqueness in Dual-Energy CT with Beam Hardening

September 13, 2017
Author(s)
Zachary H. Levine
Purpose: The goal is to determine whether dual-energy computed tomography (CT) leads to a unique reconstruction into two basis materials. Methods and Materials: The beam hardening equation is simplified to the single voxel case. The simplified equation is
Displaying 12976 - 13000 of 73697
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