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Displaying 61926 - 61950 of 74483

Laboratory Studies of Smoke Properties at NIST Past, Present, and Future

November 1, 1990
Author(s)
George W. Mulholland, Nelson P. Bryner
Burn facilities have been developed at NIST to measure the yield and optical properties of smoke at two fire scales. The small scale apparatus is used for burning samples about 10 cm in diameter (soup bowl size) and an intermediate scale apparatus is used

MMIC Package Characterization with Active Loads

November 1, 1990
Author(s)
K. R. Phillips, Dylan Williams
Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active

Progress Toward MMIC On-Wafer Standards

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks, K. R. Phillips, T. Miers
A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the National Institute of Standards and Technology and a MIMIC Phase 3 team. The coplanar standard

The Interpretation and Use of S-Parameters in Lossy Lines

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks
Although a fundamental parameter of transmission lines, the characteristic impedance is difficult to measure accurately. We suggest a method by which it may be easily determined from a measurement of the propagation constant. The method is based on a

The NIST Working Form for STEP

November 1, 1990
Author(s)
Steve Clark
The Product Data Exchange Specification (PDES) is an emerging standard for the exchange of product information among various manufacturing applications. The natural exchange medium for PDES product models is the STEP physical file format. The National PDES

Growth of YBa2Cu3O7 thin films on MgO: the effect of substrate preparation

October 30, 1990
Author(s)
Stephen E. Russek, Brian H. Moeckly, D. K. Lathrop, R A. Buhrman, Jian Li, J. W. Mayer
We discuss the results of a study on growth by laser ablation of YBa2CuO7 thin films on polycrystalline and annealed vicinal (001) MgO substrates. In both instances the films were found to grow predominantly with c axis normal to the plane of the substrate
Displaying 61926 - 61950 of 74483
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