Chandler-Horowitz, D.
, Marchiando, J.
, Doss, M.
, Krause, S.
and Visitserngtrakul, S.
(1990),
Sensitivity of Ellipsometric Modeling to the, Technical Abstracts of the 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA
(Accessed April 19, 2024)
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Sensitivity of Ellipsometric Modeling to the
Published
Author(s)
, , M. G. Doss, S. J. Krause, S. Visitserngtrakul
Proceedings Title
Technical Abstracts of the 1990 IEEE SOS/SOI Technology Conference
Conference Dates
October 2-4, 1990
Conference Location
Key West, FL, USA
Conference Title
1990 IEEE SOS/SOI Technology Conference
Pub Type
Conferences
Citation
Created October 30, 1990, Updated October 12, 2021